Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models

ABSTRACT

A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.

CLAIM OF PRIORITY

This application is a continuation of and claims the benefit of andpriority, under 35 U.S.C. § 120, to U.S. patent application Ser. No.16/455,642, filed on Jun. 27, 2019, and titled “SCHEDULING OF SCENARIOMODELS FOR EXECUTION WITHIN DIFFERENT COMPUTER THREADS AND SCHEDULING OFMEMORY REGIONS FOR USE WITH THE SCENARIO MODELS”, which is acontinuation of and claims the benefit of and priority, under 35 U.S.C.§ 120, to U.S. patent application Ser. No. 15/868,940, filed on Jan. 11,2018, titled “SCHEDULING OF SCENARIO MODELS FOR EXECUTION WITHINDIFFERENT COMPUTER THREADS AND SCHEDULING OF MEMORY REGIONS FOR USE WITHTHE SCENARIO MODELS”, and now issued as U.S. Pat. No. 10,365,326, whichis a continuation of and claims the benefit of and priority, under 35U.S.C. § 120, to U.S. patent application Ser. No. 15/497,634, filed onApr. 26, 2017, titled “SCHEDULING OF SCENARIO MODELS FOR EXECUTIONWITHIN DIFFERENT COMPUTER THREADS AND SCHEDULING OF MEMORY REGIONS FORUSE WITH THE SCENARIO MODELS”, and now issued as U.S. Pat. No.9,874,608, which is a continuation of and claims the benefit of andpriority, under 35 U.S.C. § 120, to U.S. patent application Ser. No.15/081,740, filed on Mar. 25, 2016, and titled “SCHEDULING OF SCENARIOMODELS FOR EXECUTION WITHIN DIFFERENT COMPUTER THREADS AND SCHEDULING OFMEMORY REGIONS FOR USE WITH THE SCENARIO MODELS”, and now issued as U.S.Pat. No. 9,651,619, which is a continuation of and claims the benefit ofand priority, under 35 U.S.C. § 120, to U.S. patent application Ser. No.14/689,649, filed on Apr. 17, 2015, titled “SCHEDULING OF SCENARIOMODELS FOR EXECUTION WITHIN DIFFERENT COMPUTER THREADS AND SCHEDULING OFMEMORY REGIONS FOR USE WITH THE SCENARIO MODELS”, and now issued as U.S.Pat. No. 9,316,689, which claims the benefit of and priority, under 35U.S.C. § 119(e), to U.S. Provisional Patent Application No. 61/981,711,filed on Apr. 18, 2014, and titled “Graphics Based SOC Design Tool”, allof which are hereby incorporated by reference in their entirety.

FIELD

The present embodiments relate to testing a system-on-a-chip withportable scenario models and at different horizontal and verticallevels.

BACKGROUND

A system-on-a-chip (SoC) integrates all components of a computer oranother electronic system on a chip. The SoC includes software andhardware. The SoC is used with other SoCs to develop a system forperforming a number of functions, e.g., printing, receiving data,sending data, receiving phone calls, playing virtual games, etc.

Hardware blocks of SoCs are designed using a software tool, e.g., acomputer-aided design (CAD) tool. Also, software drivers that controlthe hardware blocks are integrated within the design. The SoCs areverified for operation before being sent to a foundry. The verificationis performed using one or more languages, e.g., SystemVerilog, SystemC,and OpenVera. Any bugs found while verifying the SoC may be corrected.

However, the verification of operations of the SoC may be performedduring a later stage of development of the SoC. Traditionally, engineershave employed simulation acceleration, emulation and/or a fieldprogrammable gate array (FPGA) prototype to verify and debug bothhardware and software for SoC designs prior to tapeout. However, theacceleration, emulation, and prototyping consume a large amount of timeto create. This large amount of time increases time-to-market andreduces financial revenues.

It is in this context that embodiments described in the presentdisclosure arise.

SUMMARY

Embodiments of the disclosure provide apparatus, methods and computerprograms for testing a system-on-a-chip (SoC) with portable scenariomodels and at different horizontal and vertical levels. It should beappreciated that the present embodiments can be implemented in numerousways, e.g., a process, an apparatus, a system, a device, or a method ona computer-readable medium. Several embodiments are described below.

Some engineers have verified designs using multiple efforts and tools.For example, the engineers create tests that apply a constrained randominput stimulus. A separate checker is also developed to see if a designunder test (DUT) behaves correctly. Also, a coverage model is created tomeasure if all aspects of the DUT are tested by the random inputstimulus. This strategy has two draw backs. First, three differentefforts are made, one to develop the random input stimulus, another tocreate the checker, and another to create the coverage model. Second,the random input stimulus may not exercise all functions of interest totest the DUT.

Moreover, as designs increase in complexity, a large amount of designfunctions are not exercised using the random input stimulus. Engineersthen manually develop many test cases as sequences of stimulus thatexercise the design functions. This is expensive and time consuming.

Furthermore, some verification test cases are tied to specific testbenches and cannot be applied across all stages of a project. Forexample, the verification test cases created at an intellectual property(IP) stage of a project cannot be used at a subsystem stage and an SoCstage, e.g., a silicon full chip stage, etc., of the project, and newtests are developed at each stage. Redeveloping these tests for thedifferent stages is expensive and time consuming.

Also, different stages of the project use test cases with differentformats and mechanics. For example, a simulation stage, an emulationstage, a field programmable gate array (FPGA) prototype stage, and afinal silicon stage may all use the same design, but use test cases withdifferent formats and mechanics for efficient verification.

Also, use of different test cases for different project stages mayresult in a bug that is not found until a later stage, e.g., during thefinal silicon stage, etc., of the project. Fixing the bug delaystime-to-market potentially missing a market window completely andresulting in reduced financial revenues.

In one embodiment, a method for testing the SoC or a design of the SoCis described. The method includes developing portable multiple scenariomodels to test various combinations of functions performed by componentsof the SoC. In one embodiment, the various combinations cover all or amajority of or a pre-determined number of functions that are performedby the components. The multiple scenario models include a list offunctions of one or more of the combinations to be tested, and/or one ormore input stimulus' to be applied to execute during the test, and/orone or more expected outcomes for comparison with the results todetermine whether the one or more combinations are operational.

It should be noted that some embodiments of systems and methodsdescribed herein as being applicable to the SoC are also applicable to adesign, e.g., a software model, etc., of the SoC.

In an embodiment a method includes generating a scenario model. Forexample, an expected output is back propagated from an output node of afunction of the SoC via the function to be tested to generate an input,e.g., a stimulus, etc., of the function or via additional functions ofthe SoC to generate a stimulus. The stimulus that is generated isapplied to test a performance scenario model.

In one embodiment, a stimulus is generated without back propagating anexpected output from a function of the SoC. The stimulus that isgenerated is applied to test an application scenario model.

In one embodiment, a method for testing the SoC includes applying astimulus to an input of the SoC or an input of a function within the SoCto generate a test output, and comparing the test output with anexpected output to determine whether the SoC passed or failed a test.

In an embodiment, a method for generating a portable scenario modelusing a graph is described. The graph includes multiple sub-modulerepresentations. Each sub-module representation acts as a stimulus, or adecision-making sub-module representation, or a test output, or afunctional sub-module representation.

In an embodiment, a decision-making sub-module representation is afunctional block that results in more than one test output.

In one embodiment, an execution of a function sub-module representationresults in all functional sub-module representations that are connectedto the function sub-module representation to be evaluated.

In an embodiment, an execution of a function sub-module representationresults in one or more of functional sub-module representations that areconnected to the function sub-module representation to be evaluated.

In one embodiment, each scenario model, described herein, is a graphthat includes a number of module representations and links between themodule representations.

In an embodiment, a scenario model is generated by applying one or moreconstraints to a graph. For example, when a sub-module representation ofthe graph is executed to test the SoC, another sub-module representationof the graph cannot be executed to test the SoC. As another example,when a sub-module representation of the graph is executed to test theSoC, another sub-module representation of the graph is to be tested totest the SoC.

In one embodiment, a method is performed to determine that all inputnodes of a design of an SoC or an SoC are checked based on expectedoutputs. For example, when an SoC has eight input nodes, it isdetermined by a processor that expected outputs are back propagated toreach all the eight input nodes. If some of the input nodes cannot bereached by back propagation, the input node is determined by a processorto be an illegal input node or an input node that is missing from aportable scenario model.

In an embodiment, a method includes determining a coverage of portablescenario models. A processor determines a number of paths, e.g., pathsproviding portable scenario models, etc., in a graph that are traversedduring execution of a test of the SoC or a design of the SoC. The numberof paths traversed relative to a total number of paths in the graph thatmay be traversed provides a coverage of portable scenario models in thegraph.

In one embodiment, when a number of paths in a graph is larger than apre-determined number to traverse during a test, a processor identifiespaths that are more crucial than others for traversal during a test ofthe SoC or a design of the SoC. In an embodiment, instead of identifyingpaths, a processor identifies sub-module representations or modulerepresentations within a graph that are more crucial than othersub-module representations or module representations of the graph. Theprocessor then identifies paths that pass through the more crucialsub-module representations or module representations. The identifiedpaths are traversed during execution of a test of the SoC or a test of adesign of the SoC.

In an embodiment, a method includes using a portable scenario model togenerate test cases for test benches at each stage of the project. Forexample, at the IP stage, a test file generated from the portablescenario model includes a transaction using inputs and outputs of an IPblock of the IP stage, and at the SoC stage includes the transactionusing inputs and outputs and additional transactions that use aprocessor of the SoC stage and/or that use I/Os of the SoC. As anotherexample, the portable scenario model is used to test the SoC stage. Inthis example, back-door memory checks, e.g., accessing data from amemory device of the SoC and checking against an expected output, etc.,are performed or a CPU of the SoC is used to compute checksums of datastored in the memory device to increase a rate of testing the SoC at theSoC stage of the project. The preceding example also applies theemulator stage of the SoC or the prototype stage of the SoC. An emulatorof an SoC is checked at an emulation stage of the project and aprototype of the SoC is tested at the prototype stage of the project.

In an embodiment, a method includes generating application scenariomodels or performance scenario models from multiple driver scenariomodels. For example, portable driver scenario models for individualfunctions, e.g., for each IP of the SoC, etc., are combined, e.g.,connected together via links, etc., to define application scenariomodels or performance scenario models. In one embodiment, theapplication scenario models or the performance scenario models includeapplication of all functions or a majority of functions of the SoC.

In one embodiment, a method includes scheduling tests, e.g., generatingtest files for execution, etc., across multiple processors.

In an embodiment, a consumer scenario model, e.g., a driver scenariomodel, etc. is scheduled to start after finish of execution of aproducer scenario model, e.g., a driver scenario model, etc.

In one embodiment, multiple threads, e.g., multiple test files, etc.,are executed by a processor. For example, multiple test files arescheduled to run concurrently, e.g., to be executed in a multi-taskingmanner by a processor.

In an embodiment, a visual representation of a schedule showing a timingrelation between the producer and consumer scenario models is displayedby a graphical processing unit on a display device.

In an embodiment, a method includes scheduling memory usage foroperations within a test, e.g., conducted using a test file, etc. Thememory usage involves using multiple memory regions.

In an embodiment, a visual representation of a scheduling of use ofmultiple memory regions is displayed by the graphical processing unit onthe display device.

In one embodiment, a memory region is reused during a test based onlocality of the memory region compared to other memory regions.

In an embodiment, a method includes sending messages from a test filegeneration module executed on a processor to a test bench agent, e.g., abus verification intellectual property (VIP), a CPU, etc., to coordinateoperations between the test file generation module and an I/O of an SoC.For example, test file generation module executes a test file to programa universal asynchronous receiver/transmitter (UART) of the SoC totransmit data, wait till the transmission is complete, and then sends amessage to the test bench agent to check that the correct data wastransmitted on the UART. In one embodiment, such messages are used togenerate debug messages, e.g., messages indicating that the correct datawas not transmitted, etc. In an embodiment, such messages are used tomeasure a level of concurrency that has been achieved in a test. Forexample, the messages are used to determine how often two power domainshave powered up within a thousand cycles of each other to facilitate anindication or a lack thereof of a brown-out situation on a power grid.

In an embodiment, an expected output and a desired output are usedinterchangeably herein.

In one embodiment, a method for testing a system-on-a-chip (SoC) isdescribed. The method includes receiving a file describing the SoC andparsing the file to determine one or more functions to be performed byone or more hardware components of the SoC. The SoC is fabricated on oneor more chips. The method further includes receiving a desired output ofthe SoC and generating a test scenario model based on the desired outputof the SoC and the functions to be performed. The test scenario modelincludes one or more module representations of the functions andincludes one or more connections between two of the modulerepresentations. Each connection provides a direction of flow of databetween the two module representations. The desired output acts as aperformance constraint for the test scenario model. The test scenariomodel further includes an input of the SoC that is generated based onthe desired output, the module representations, and the one or moreconnections. The test scenario model includes a path from the input viathe module representations and the connections to the desired output.The method is executed by a processor.

In an embodiment, another method for testing an SoC is described. Themethod includes receiving one or more scenario models. Each scenariomodel provides a path of a direction of execution of one or moreintellectual property (IP) blocks associated with an SoC. The methodfurther includes generating one or more test files using the scenariomodels. The scenario models further include one or more inputsassociated with the SoC that are generated based on one or more expectedoutputs associated with the SoC.

In one embodiment, yet another method for testing an SoC is described.The method includes receiving multiple scenario models. Each scenariomodel is used for execution of one or more intellectual property (IP)blocks along a path. The path is used for generating a test output basedon a stimulus that is received at an input of the path. The method alsoincludes executing a first test bench to execute the at least one of thescenario models to further generate one or more test outputs andexecuting a second test bench to execute the at least one of thescenario models to further generate one or more test outputs. The methodincludes comparing the test outputs generated by executing the firsttest bench with one or more expected outputs to determine whether asystem-on-a-chip (SoC) passes a test at a first stage of a project. Themethod includes comparing the test outputs generated by executing thesecond test bench with one or more expected outputs to determine whetherthe SoC passes a test at a second stage of a project. The method isexecuted by a processor.

In one embodiment, a method includes receiving multiple applicationscenario models, which are generated for testing one or more systems onchips (SoCs). The application scenario models include a plurality ofdriver scenario models and a plurality of sequences of execution of thedriver scenario models. Moreover, each application scenario model isgenerated by back propagating an expected output of the applicationscenario model to generate an input to be provided to the applicationscenario model during a test of the one or more SoCs. The method furtherincludes splitting the application scenario models into a pre-determinednumber of computer threads. Each computer thread includes at least onebut not all of the driver scenario models. The method includes splittingthe sequences into a plurality of flows between the driver scenariomodels of the computer threads. The method includes providing fortesting of the one or more SoCs the driver scenario models within thecomputer threads and the plurality of flows between the driver scenariomodels of the computer threads.

In an embodiment, a method includes receiving multiple applicationscenario models, which include a plurality of driver scenario models andsequences of application of the driver scenario models. The applicationscenario models are used for testing one or more SoCs. Moreover, eachapplication scenario model is generated by back propagating an expectedoutput of the application scenario model to generate an input to beprovided to the application scenario model during a test of the one ormore SoCs. The method further includes splitting multiple memoryaddresses into a plurality of memory regions. Each of the memory regionsis exclusive of any other of the memory regions. Also, one of the driverscenario models of one of the application scenario models includesreading data from one of the memory regions. Another one of the driverscenario models of the one of the application scenario model includeswriting data to another one of the memory regions.

In one embodiment, a system includes a memory device for storingapplication scenario models, which are generated for testing one or moreSoCs. The application scenario models include a plurality of driverscenario models and a plurality of sequences of execution of the driverscenario models. Each application scenario model is generated by backpropagating an expected output of the application scenario model togenerate an input to be provided to the application scenario modelduring a test of the one or more SoCs. The system further includes aprocessor coupled to the memory device. The processor receives theapplication scenario models. The processor further splits theapplication scenario models into a pre-determined number of computerthreads. Each computer thread includes at least one but not all of thedriver scenario models. The processor further splits the sequences intoa plurality of flows between the driver scenario models of the computerthreads. The processor provides for testing of the one or more SOCs thedriver scenario models within the computer threads and the plurality offlows between the driver scenario models of the computer threads.

In one embodiment, a method includes generating a graphical display ofmultiple computer threads. Each computer thread includes one or moredriver scenario models. Each driver scenario model includes a functionassociated with a test of one or more SoCs. The method further includesidentifying a flow of execution of the driver scenario models from oneof the computer threads to another one of the computer threads. The flowof execution provides a sequence in which the one of the computerthreads and the other one of the computer threads are executed.

In an embodiment, a method includes receiving multiple applicationscenario models, which include a first driver scenario model and asecond driver scenario model and a flow of execution of the first andsecond driver scenario models. The application scenario models areexecuted for testing one or more SoCs. The method further includesassigning the first driver scenario model to a first computer thread andthe second driver scenario model to a second computer thread. The methodalso includes providing the first driver scenario model, the seconddriver scenario model, the flow of execution, the assignment of thefirst driver scenario model to the first computer thread, and theassignment of the second driver scenario model to the second computerthread for testing a design of the one or more SoCs. The method includesgenerating a graphical display of the first and second computer threadsto indicate the flow between execution of the first and second driverscenario models.

In one embodiment, a system includes a memory device for storing dataassociated with a graphical display of multiple computer threads. Eachcomputer thread includes one or more driver scenario models. Each driverscenario model includes a function associated with a test of one or moreSoCs. The system further includes a processor coupled to the memorydevice. The processor generates the graphical display and identifies aflow of execution of the driver scenario models from one of the computerthreads to another one of the computer threads. The flow of executionprovides a sequence in which the one of the computer threads and theother one of the computer threads are executed.

Some advantages of the embodiments described in the present disclosureinclude generation of a test file from scenario models by a processor,verification of a chip design at a driver scenario model level, andverification by a processor that a flow of data occurs betweenintellectual property (IP) blocks, fabric module representations, andmemory device module representations.

Additional advantages of the embodiments described in the presentdisclosure include verification by a processor of power and clockmanagement at one or more stages, e.g., an IP stage, a subsystem stage,an SoC stage, a simulation stage, an emulation stage, a prototypingstage, a post-silicon stage, etc., of a project of developing an SoC.For example, a system and power control module representation isexecuted by a processor to provide power to an IP block at the IP stageand is also executed to provide power to multiple IP blocks at thesubsystem stage. An amount of the power provided is compared with anexpected amount of power at each of the IP and subsystem stages todetermine whether the amount of power matches or is within apre-determined range of the expected power to further determine whetherthe system and power control module representation is functioning atboth the stages.

In one embodiment, the amount of power provided by the system and powercontrol module representation at the IP stage is compared with theamount of power provided by the system and power control modulerepresentation at the subsystem stage to determine whether the systemand power control module representation is functioning.

In an embodiment, the amount of power received by an IP block at the IPblock stage is compared with the amount of power received by the IPblock at the subsystem stage to determine whether the system and powercontrol module representation is functioning.

As an example of verification by a processor of clock management at theone or more stages, a clock module representation is executed by aprocessor at the IP stage to determine whether a clock signal that isgenerated and supplied by the clock module representation matches or iswithin a predetermined threshold of an expected clock signal output. Asanother example of verification by a processor of clock management atthe one or more stages, a clock module representation is executed by aprocessor at the simulation stage to determine whether a clock signalthat is generated and supplied by the clock module representationmatches or is within a predetermined threshold of an expected clocksignal output. As yet another example of verification by a processor ofclock management at the one or more stages, a clock modulerepresentation is executed by a processor at the subsystem stage todetermine whether a clock signal that is generated and supplied by theclock module representation matches or is within a predeterminedthreshold of a clock signal that is generated by the clock modulerepresentation during the IP block stage.

Further advantages of the embodiments described in the presentdisclosure include integrating one or more scenario models into a testbench, verification by a processor of operations of one or more IPblocks at the one or more stages, and verification by a processor of awidth of a bus fabric module representation. For example, to verify thewidth of the bus fabric module representation, it is determined whetherthe bus fabric module representation hangs under stress. To furtherillustrate, an amount of data that is greater than the width of the busfabric module representation is passed through the bus fabric modulerepresentation to determine whether the bus fabric module representationmanages the passage of data or becomes nonfunctional under stress.

Additional advantages of the embodiments described in the presentdisclosure include detection by a processor of failure of a memorydevice module representation, e.g., a memory bank module representation,a virtual memory, etc., upon access by multiple IP blocks to the memorydevice module representation. Another advantage of the above-describedembodiments include determining by a processor whether an IP block of anSoC, or a subsystem of the SoC, or a simulation of the SoC, or anemulator of the SoC, or a prototype of the SoC, or a post-silicon SoC,or a combination thereof, hangs when there is a change in a state, e.g.,a change from a low state to a high state, a change from the high stateto the low state, a change from 1 to 0, a change from 0 to 1, etc., of aclock signal that is supplied by the system and power control modulerepresentation.

Another advantage of the embodiments described in the present disclosureinclude revelation by a processor of an address decode bug when anaddress of a memory device module representation is accessed by multipleIP blocks. Another advantage of the embodiments described in the presentdisclosure includes graphical presentation of test cases andverification. For example, the graphical presentation includes bargraphs that further include driver scenario models and a chainindicating a sequence of execution of the driver scenario models.Moreover, the driver scenario models are coded based upon whether adriver scenario model has finished execution, is waiting for execution,or is hanging. In one embodiment, the coding of the driver scenariomodels is based on different colors, or different patterns, or differentshades of color. The graphical presentation allows a user to morequickly debug a test computer program code or a compiled computerprogram code than one without the graphical presentation.

Moreover, another advantage of the embodiments described in the presentdisclosure includes execution of scenario models to capture knowledge ofan SoC at the one or more stages of the project. An additional advantageof the embodiments described in the present disclosure includegeneration of a large number, e.g., 1000-3000, 1500-2000, etc., of testcases, e.g., scenario models, etc., for testing an SoC at the one ormore stages of the project. Such generation of the large number of testcases is difficult when done by hand.

Furthermore, an advantage of the embodiments described in the presentdisclosure is that the test cases are executed by multiple processorsand/or in multiple threads to mimic an actual performance of an SoC. Forexample, when the SOC includes three processors, the test cases aregenerated to include three processor module representations. As anotherexample, when the SOC executes 10 threads on one processor, the testcases are generated to include 10 threads executed by one centralprocessing unit (CPU) module representation.

Another advantage of the embodiments described in the present disclosureinclude exercising with the test cases of end-to-end use of multipledriver scenario models to measure performance of the multiple driverscenario models during the end-to-end use. For example, at one end of anapplication scenario model of a digital camera is a driver scenariomodel that includes a charge-coupled device (CCD) module representationand at another end is a driver scenario model that includes a securedigital (SD) card module representation. Between the CCD modulerepresentation and the SD card module representation is a camera modulerepresentation, an image processor module representation, and an SD cardcontroller module representation. The CCD module representation iscoupled to the camera module representation, which is coupled to theimage processor module representation. The image processor modulerepresentation is coupled to the SD card controller modulerepresentation.

Yet another advantage of the embodiments described in the presentdisclosure includes automated generation of test cases by a processorfrom modified scenario models. Another advantage of the embodimentsdescribed in the present disclosure includes that the test cases areoptimized for rapid runtime.

An advantage of the embodiments described in the preset disclosureincludes allowing a single portable scenario model that describesfunctions, expected outcomes and/or stimulus, instead of three separateefforts to create random stimulus, checks and a coverage model.

Another advantage of the embodiments described in the preset disclosureis that back propagating from an expected outcome via a feature, e.g.,module representation, sub-module representation, functional block,etc., to generate a stimulus to create a scenario model that exercisesthe feature in a focused manner instead of relying on random chance tocreate a sequence to exercise the feature. Use of the scenario models tocover different features of the SoC to systematically satisfy a coveragetarget further reduces a number of redundant tests that are run.

An advantage of the embodiments described in the preset disclosure isthat by using reachability analysis, e.g., generation of a stimulus froman expected outcome, etc., on the portable scenario models, it ispossible to analyze an amount of verification intent that is covered bythe scenario models before any tests are run. Previously, tests were runto collect coverage data to further understand a quality of testcoverage.

Yet another advantage of the embodiments described in the presetdisclosure is that IP driver scenario models are combined to generateapplication scenario models to further test interactions between theIPs, instead of having to manually develop new test cases that combinethe IPs.

Another advantage of the embodiments described in the preset disclosureis that the same portable scenario model can be used to generate testsfor test benches at different stages of the project, e.g., tests for I/Otransactions at an IP block stage of the project, tests at the SoCstage, etc. The same portable scenario model is used to generate testcases optimized for each stage of the project without having to developnew tests.

An advantage of the embodiments described in the preset disclosure isthat concurrent operations can be scheduled across a plurality ofprocessors and/or threads.

Other aspects will become apparent from the following detaileddescription, taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The embodiments may best be understood by reference to the followingdescription taken in conjunction with the accompanying drawings.

FIG. 1A is a diagram of a system for illustrating use of scenario modelsin testing a system-on-a-chip (SoC), in accordance with one embodimentdescribed in the present disclosure.

FIG. 1B is a continuation of the system of FIG. 1A, in accordance withone embodiment described in the present disclosure.

FIG. 2A-1 is a diagram of a system for using a scenario model todetermine whether the SoC failed or passed the test, in accordance withone embodiment described in the present disclosure.

FIG. 2A-2 is a continuation of the system of FIG. 2A-1 , in accordancewith one embodiment described in the present disclosure.

FIG. 2B-1 is a diagram of a system to illustrate an example of a testbench of FIG. 2A-2 , in accordance with one embodiment described in thepresent disclosure.

FIG. 2B-2 is a diagram of a universal verification methodology (UVM)test bench to illustrate multiple application scenario models, inaccordance with one embodiment described in the present disclosure.

FIG. 2B-3 is a diagram of a graph to illustrate multiple applicationscenario models, in accordance with one embodiment described in thepresent disclosure.

FIG. 2B-4 is a diagram of a graph to illustrate an application scenarioof power management, in accordance with one embodiment described in thepresent disclosure.

FIG. 3 is a diagram of a system to illustrate use of driver scenariomodels, and use of an application scenario model, in accordance with oneembodiment described in the present disclosure.

FIG. 4-1 is a diagram of a system to illustrate horizontal and verticalintegration of an SoC scenario model in various stages of a project ofdeveloping a post-silicon SoC, in accordance with one embodimentdescribed in the present disclosure.

FIG. 4-2 is a diagram of a system to illustrate multi-level designsupport, in accordance with one embodiment described in the presentdisclosure.

FIG. 5 is a diagram of a system to illustrate use of an SoC scenariomodels to test an SoC, in accordance with one embodiment described inthe present disclosure.

FIG. 6 is a diagram of a system for testing a post-silicon SOC, inaccordance with one embodiment described in the present disclosure.

FIG. 7 is a diagram of a graph to illustrate a scenario model, one ormore expected outputs of the scenario model, and generation of one ormore inputs of the scenario model based on one or more constraints, inaccordance with one embodiment described in the present disclosure.

FIG. 8-1 is a diagram of a graph for illustrating a constraint of adriver scenario model affecting another driver scenario model, inaccordance with one embodiment described in the present disclosure.

FIG. 8-2 is a diagram of a system for illustrating a manner in which adriver scenario model provides a constraint to another driver scenariomodel, in accordance with one embodiment described in the presentdisclosure.

FIG. 8-3 is a diagram of a system to illustrate use of one or moreconstraints to control processing performed by a video processor modulerepresentation, in accordance with one embodiment described in thepresent disclosure.

FIG. 8-4 is a diagram of a graph for illustrating use of an applicationscenario model that includes memory device module representations forstoring data to be used by intellectual property (IP) blocks, inaccordance with one embodiment described in the present disclosure.

FIG. 8-5 is a diagram of an embodiment of graph to illustrate aperformance scenario model, in accordance with one embodiment describedin the present disclosure.

FIG. 9-1 is a diagram of a graph to illustrate a division of a scenarioacross multiple central processing units (CPUs), in accordance with oneembodiment described in the present disclosure.

FIG. 9-2 is a diagram of a graph to illustrate use of memory devicemodule representations to store data for access by one or more driverscenario models, in accordance with one embodiment described in thepresent disclosure.

FIG. 10 is a diagram of a system for illustrating execution of multiplescenario models in parallel by a processor or by multiple CPUs or byexecution of multiple threads, in accordance with one embodimentdescribed in the present disclosure.

FIG. 11 is a diagram of a display screen to illustrate use of multiplethreads and multiple CPUs to execute a number of scenario models, inaccordance with one embodiment described in the present disclosure.

FIG. 12 is a diagram of a computer program code to enable integration ofSOC scenario models into a test bench, in accordance with one embodimentdescribed in the present disclosure.

FIG. 13 is a diagram of a screen shot for illustrating visualization ofone or more paths of a number of scenario models, in accordance with oneembodiment described in the present disclosure.

FIG. 14A is a diagram of a system to illustrate generation of averification space from a description of a component of an SoC, inaccordance with one embodiment described in the present disclosure.

FIG. 14B is a diagram of a system to illustrate generation of a stimulusfrom an expected output of a pipeline scenario model, in accordance withone embodiment described in the present disclosure.

FIG. 14C is a diagram of a system to illustrate generation of stimulifrom expected outputs of a switch scenario model, in accordance with oneembodiment described in the present disclosure.

FIG. 14D is a diagram of a system to illustrate generation of a stimulusfrom an expected output of a pipeline scenario model, in accordance withone embodiment described in the present disclosure.

FIG. 14E-1 is a diagram of a scenario model to illustrate generation ofverification spaces for performing a write operation, in accordance withone embodiment described in the present disclosure.

FIG. 14E-2 is a diagram of a scenario model to illustrate generation ofverification spaces for performing a read operation, in accordance withone embodiment described in the present disclosure.

FIG. 14F is a diagram of a system for generating a stimulus fordisplaying video data and then generating test display data based on thestimulus to be compared with expected display data, in accordance withone embodiment described in the present disclosure.

DETAILED DESCRIPTION

The following embodiments describe systems and methods for testing asystem-on-a-chip (SoC) with scenario models and at different horizontaland vertical levels. It will be apparent that the present embodimentsmay be practiced without some or all of these specific details. In otherinstances, well known process operations have not been described indetail in order not to unnecessarily obscure the present embodiments.

In one embodiment, the SoC is an integrated circuit (IC) that integratesall components, e.g., a memory device, a processor, an input/output, abus, etc., of a computer or another electronic system into a chip. Forexample, the SoC includes digital, analog, mixed-signal, and oftenradio-frequency functions-all on a chip substrate. In an embodiment, theSoC includes a microcontroller.

In an embodiment, instead of the SoC, a system-in-package (SIP) is used.The SIP includes a number of chips in a single package. In a number ofembodiments, instead of the SoC, a package-on-package stacking is usedduring circuit board assembly. For example, the package-on-packagestacking includes the SoC chip, which further includes processors andnumerous digital peripherals, and comes in a ball grid package withlower and upper connections. The lower balls connect to the board andvarious peripherals, with the upper balls in a ring holding memory busesused to access memory devices, e.g., a flash memory, a register, aflip-flop, a virtual memory, a read-only memory (ROM), and a randomaccess memory (RAM). Other examples of memory devices include aread-only memory, a volatile memory, a non-volatile memory, a redundantarray of storage disks, a hard disk, etc.

FIGS. 1A and 1B are diagrams of an embodiment of a system 100 forillustrating use of scenario models in testing the SoC. The system 100includes a processor 101 that receives a file. Examples of a processorinclude a microcontroller, an application specific integrated circuit(ASIC), a programmable logic device (PLD), a central processing unit(CPU), etc.

The file defines the SoC. For example, the file includes a descriptionof components of the SoC, connections between the components, one ormore output nodes of each component, one or more input nodes of eachcomponent, functions performed by the components, and functionsperformed by the connections. Examples of the components include aprocessor, a page translation unit, a cache, a clock, a power managementdevice, a memory device, a controller, an input/output (I/O) device, abus, a fabric, a switch, a charge-coupled device (CCD), etc.

In one embodiment, the description of the components of the SOC in thefile is in a programming language, e.g., a C+ programming language, aC++ programming language, etc. In an embodiment, the description of theSoC is performed using graphics that show the components and connectionsbetween the components.

The processor 101 parses the file to identify the output nodes of eachcomponent, and to further identify the functions of the components.Examples of the output nodes include output node 1, output node 2, andso on until output node N, where N is a number of the components.Moreover, examples of the functions include a function 1, a function 2,and so on until a function N.

In one embodiment, each component performs more than one function, e.g.,a primary function, a secondary function, etc., and has a number ofoutput nodes that matches the number of functions performed by thecomponent. In the embodiment, a number of functions performed do notmatch a number of components. For example, the number of functions,e.g., M functions, etc., performed by a component is greater than orless than a number of the components, where M is an integer greater thanone.

In an embodiment, functions of components of the SoC are received by theprocessor 101 from the user via an input device, which is coupled to theprocessor 101 via an input/output interface, e.g., a universal serialbus (USB) interface, a parallel port, a serial port, etc.

The processor 101 generates a module representation for each function.For example, upon parsing the file, the processor 101 generates a modulerepresentation 1 for the function 1 and generates a modulerepresentation N for the function N. As another example, the processor101 generates a module representation that portrays a read controllercorresponding to a function of reading data from a memory device. As yetanother example, the processor 101 generates a module representationthat describes an image encoder for a function of encoding image data.The modules 1 thru N form a graphical layout.

Each module representation is connected by the processor 101 to one ormore output nodes, e.g., the output node 1, the output node 2, etc.,based on a relationship between a corresponding component and one ormore outputs, e.g., signals, data, values, etc., of the component. Anoutput is generated by a component by performed one or more functions.Examples of outputs of a module representation include an image that isdisplayed on a display device, an image that is stored in a memorydevice, and multimedia that is stored in a memory device or is displayedon a display device, etc. Examples of multimedia include a combinationof audio and video, or a combination of an image and audio, acombination of an animation and audio, a picture in a picture, etc. Theconnection between the module representation and one or more of theoutput nodes is performed to include the one or more of the output nodesas a part of the module representation. For example, upon determiningthat a component of the SoC has two outputs, the processor 101integrates a module representation of the component with two outputnodes, e.g., an output node 1-1 and an output node 1-2. It should benoted that in an embodiment, the output nodes 1-1 and 1-2 are sub-nodesof the output node 1. As another example, upon determining that acomponent of the SoC produces a number of outputs, the processor 101integrates a module representation of the component with the same numberof output nodes.

The processor 101 identifies an output node from the output nodes thatare connected to the module representations. The output node identifiedis an output associated with an application of one or more functions ofthe SoC. For example, the processor 101 identifies the output node N,which is generated by displaying an image on a display device. As usedherein, examples of a display device include a display device of acamera, a display device of a computer, a display device of a cellphone, a display device of a smart phone, a display device of a tablet,etc. Further examples of a display device include a liquid crystaldisplay (LCD), a light emitting diode (LED) display, a plasma display,etc. As another example, the processor 101 identifies the output node 1,which is generated from an application of capturing an image and storingthe image in a memory device.

It should be noted that in an embodiment, some of the output nodes 1thru N affect one or more of the remaining of the output nodes 1 thru N.For example, an output at one of the output nodes 1 thru N adds aconstraint to an output at another one of the output nodes 1 thru N.Both the output at the output node that affects the output at the otheroutput node of the 1 thru N output nodes by adding the constraint andthe output that is affected are associated with the same application. Tofurther illustrate, when an output at one of the output nodes 1 thru Nis achieved, an output at another one of the output nodes 1 thru Ncannot be achieved. As another illustration, when a high quality pictureis displayed on a display device, a low quality image cannot bedisplayed on the display device. As yet another illustration, when a caris controlled to be turned on, the car cannot be controlled to be turnedoff. As another illustration, at a time a cell phone screen isdisplaying a video, the cell phone screen cannot display another video.

In one embodiment, an output at one of the 1 thru N output nodes thataffects an output at another output node of the 1 thru N output nodes byadding the constraint and the output that is affected are associatedwith different applications. For example, when a camera is displaying animage, the camera cannot capture an image. As another example, when acell phone is displaying a video, the cell phone cannot capture anothervideo of an environment surrounding the user. The user operates the cellphone.

The processor 101 uses one of the 1 thru N output nodes that isidentified and a number of applications to be achieved to generate anumber of scenario models for the output node. Examples of the scenariomodels include a performance scenario model, an application scenariomodel, a driver scenario model (DSM), etc. Examples of the applicationsinclude storing an image, capturing an image, writing, reading, encodingan image, decoding an image, transferring an image, any of the functionsdescribed herein, a combination of the functions described herein, etc.

In an embodiment, the processor 101 combines two or more of thefunctions to generate an application from the combination. In oneembodiment, an application to be performed using the one or more of themodule representations 1 thru N is received from the user via the inputdevice.

It should be noted that a performance scenario model is similar to theapplication scenario model except that in the performance scenariomodel, a test output is compared with an expected output to determinewhether an SoC or a design of the SoC passed a test. In the application,no such comparison is performed after generating a test output and thetest output is manually analyzed. Examples of the performance scenariomodel, the application scenario model, and the driver scenario model areprovided below.

A scenario model is generated based on the one of the 1 thru N outputnodes that is identified, one of more of the module representations 1thru N, and the one or more applications of an SoC. For example, theprocessor 101 retrieves the Nth output node that is identified from amemory device, provides a seed as an expected output of the Nth outputnode to achieve an application, and applies a function of the Nth modulerepresentation having the Nth output node to generate an input at aninput node of the Nth module representation. Examples of the seedinclude an image, image data, multimedia data, video, video data, anexpected output, etc. As another example, when an application is that ofcapturing and storing an image, the seed is the image. As yet anotherexample, when an application is that of writing data to a memory device,the seed is the data. In one embodiment, the seed is provided within thefile that is parsed by the processor 101. In an embodiment, the seed isprovided by the user via the input device to the processor 101. Theinput node of the Nth module representation is an output node of the(N−1)th module representation.

The processor 101 further determines based on a function that precedes afunction performed by the Nth module representation, the application,and the seed that the (N−1)th module representation is to be connectedto the Nth module representation. The input at the input node of the Nthmodule representation is further used by the processor 101 as an outputof the (N−1)th module representation. An input at an input node of the(N−1)th module representation is generated by the processor 101 basedthe output at the output node of the (N−1)th module representation. Insuch a manner, the processor 101 back propagates the output at theoutput node of the Nth module representation to achieve an application.

The processor 101 back propagates the output at the output node of theNth module representation to generate the scenario model, which includesa group of the N module representations and links between a number ofthe N module representations. To illustrate, the processor 101 generatesthe scenario model as a group of the Nth module representation and the(N−1)th module representation, and a link between the (N−1)th modulerepresentation and the Nth module representation. In one embodiment, alink has a direction opposite to that of the back propagation. Forexample, a link is forward propagating between the (N−1)th module andthe Nth module representation when an input of the Nth module is backpropagated to generate an input, e.g., a stimulus, etc., of the (N−1)thmodule representation. To further illustrate, a link points from the(N−1)th module to the Nth module when an input of the Nth module is backpropagated to generate an input of the (N−1)th module representation. Inan embodiment, a link is bi-directional.

As another example of generation of the scenario model, the processor101 retrieves from a memory device module representation, a quality of adecoded image to be displayed on a display device, generates a displaycontroller module representation to facilitate rendering of the decodedimage on the display device, determines that a decoder modulerepresentation be connected to the display controller modulerepresentation to decode encoded image data to achieve the quality ofthe decoded image, and connects the decoder module representation to thedisplay controller module representation. The processor 101 generatesdecoded image data at an input node of the display controller modulerepresentation based on the quality of the decoded image to be displayedand based on the decoded image data generates the encoded image data atthe input of the decoder module representation. In this example, thedisplay controller module representation is an example of the Nth modulerepresentation and the decoder module representation is an example ofthe (N−1)th module representation. The processor 101 generates thescenario model as a group of the decoder module representation and thedisplay controller module representation and a link connecting thedecoder module representation to the display controller modulerepresentation.

An example of the scenario model is illustrated as a scenario model 102in FIG. 1A. The scenario model 102 includes module representations A, B,C, D, E, F, and G. For example, the module representation D is anexample of the Nth module representation and the module representation Cor G is an example of the (N−1)th module representation. Moreover, thescenario model 102 includes links l1, l2, l3, l4, l5, l6, and l7, eachof which is an example of a direction of flow.

The processor 101 determines whether additional output nodes of the SoCare identified from the parsed file. In response to determining that theadditional output nodes are identified from the parsed file, theprocessor 101 generates additional scenario models for additionalapplications of the SoC from the additional output nodes in a mannersimilar to that described above.

In one embodiment, an output of the Nth module representation is backpropagated by the processor 101 via the Nth module representation togenerate an input of the Nth module representation. Similarly, theinput, which is an output of the (N−1)th module representation is backpropagated by the processor 101 via the (N−1)th module representation togenerate an input of the (N−1)th module representation. By progressivelygenerating an input of a module representation from an output of themodule representation, a stimulus, e.g., an input, etc., of a scenariomodel is determined by the processor 101.

As shown in FIG. 1B, the scenario models that are to be executed by atest bench are generated by the processor 101 from the parsed file. Itshould be noted that in one embodiment, scenario models are generatedmanually by the user via an input device, e.g., a keyboard, a stylus, amouse, a touch screen, a keypad, etc., of a computing device in whichthe processor 101 is implemented. For example, the scenario models, asdescribed herein, are generated by the user and received by theprocessor 101 from the user to generate one or more test files. Examplesof the computing device include a desktop computer, a laptop computer, acell phone, a smart phone, a tablet, etc.

In one embodiment, one or more test files store one or more scenariomodels to facilitate availability of the one or more scenario models toa computer program, e.g., a test bench, etc. In an embodiment, one ormore test files are modified or deleted by using a computing device.

In an embodiment, multiple test files are compiled by the processor 101or by another processor to generate a compiled file, which is providedby the processor 101 to a test file generation module 110.

In one embodiment, a module, as used herein, is a computer software thatis executed by a processor or is hardware or a combination thereof.Examples of a hardware of a module include an ASIC, a PLD, etc.

The processor 101 executes the test file generation module 110 to parsea compiled file that includes the scenario models to further generateone or more test files. Each test file includes a scenario model. Forexample, the processor 101 parses a compiled file that includes multiplescenario models to generate a test.c file or a test.C file that includesone the scenario models, and to further generate another test.c file ora test.C file that includes another one of the scenario models. Theprocessor 101 executes a compiler program to compile each test file intoa compiled file.

The compiled files generated from the test files are provided by theprocessor 101 to a test bench program. The test bench program is avirtual environment used to verify functioning or soundness of thescenario models. In one embodiment, the test bench program is executedby the processor 101. In another embodiment, the test bench program isexecuted by a processor other than the processor 101 that generates acompiled file.

In an embodiment, the test bench program executes module representationsof the components of the SoC. A path from an input node of one of themodule representations to an output node of the same or another modulerepresentation is provided by a scenario model to the test benchprogram.

The test bench program is executed to execute the scenario models. Forexample, the processor 101 provides an input that is determined as theinput of the Nth module representation from the output at the Nth outputnode as a stimulus to execute one of the scenario models. As anotherexample, the processor 101 provides an input that is determined as theinput of the (N−1)th module representation from the output at the(N−1)th output node as a stimulus to execute one of the scenario models.As another example, the processor 101 provides an input that isdetermined at the input of the 1^(st) module representation from anoutput at the 1^(st) output node as a stimulus to execute one of thescenario models.

When the test bench program is executed, a number of test outputs aregenerated by the processor 101. For example, when the test bench programis executed, a test output is generated at the Nth output node based onthe stimulus provided to the Nth module representation. As anotherexample, upon execution of the test bench program, a test output isgenerated at the (N−1)th output node based on a stimulus provided as aninput to the (N−1)th module representation. As yet another example, uponexecution of the test bench program, a test output is generated at theNth output node based on a stimulus provided as an input to the (N−1)thmodule representation. As still another example, in response toexecution of the test bench program, a test output is generated at theNth output node based a stimulus provided as an input to the 1^(st)module representation.

In an embodiment, a number of stimulus' provided is equal to a number ofapplications of the SoC. For example, when the SoC is to be tested for adecoding application and an encoding application, two stimulus's areprovided. In this example, one stimulus includes an encoded image totest the decoding application and another stimulus includes a decodedimage to test the encoding application.

The processor 101 compares the test output to a corresponding expectedoutput. The processor 101 parses a compiled file that is generated froma test file to retrieve the one or more expected outputs. It should benoted that an expected output corresponds to the test output when theexpected output is at the same node as that of the test output. Forexample, an expected output at the Nth output node corresponds to a testoutput when the test output is at the Nth output node.

The processor 101 determines whether a test passed or failed based on aresult of the comparison of the test output with the correspondingexpected output. For example, the processor 101 determines whether thetest output matches the corresponding expected output. Upon determiningthat the test output matches the corresponding expected output, theprocessor 101 determines that the test passed. On the other hand, upondetermining that the test output does not match the correspondingexpected output, the processor 101 determines that the test failed. Asanother example, the processor 101 determines whether the test output iswithin a pre-determined threshold of the corresponding expected output.The pre-determined threshold is provided by the user via the inputdevice to the processor 101. In one embodiment, the processor 101randomly generates the pre-determined threshold. Upon determining thatthe test output is within the pre-determined threshold of thecorresponding expected output, the processor 101 determines that thetest passed. On the other hand, upon determining that the test output isoutside the pre-determined threshold of the corresponding expectedoutput, the processor 101 determines that the test failed.

FIGS. 2A-1 and 2A-2 are diagrams of an embodiment of a system 200 forusing the scenario model to determine whether the SoC failed or passedthe test. The system 200 includes a file 202 that defines the SoC. Thefile 202 is parsed by the processor 101 to identify functions of thecomponents of the SoC, to generate the N module representations based onthe functions and one or more applications of the SoC, and to generatelinks between the N module representations based on the functions andone or more applications of the SoC. Moreover, the file 202 is parsed bythe processor 101 to identify one or more expected outputs, e.g., seeds,etc. A test scenario model generator 204 that is executed by theprocessor 101 generates a compiled file that includes one or morescenario models 206 (shown in FIG. 2A-2 ) from the N modulerepresentations and the links between the N module representations. Theexpected outputs are provided by the processor 101 to the test scenariomodel generator 204.

The scenario models 206 include a memory map, e.g., a link, etc.,between a module representation and a memory device modulerepresentation, e.g., an address, a set of addresses. As an example, amemory map includes identifications of registers and fields that supporteach intellectual property (IP) block, and available instances of eachmemory device module representation with available base addresses of thememory device module representations. In one embodiment, an IP block isa module representation except for a memory device modulerepresentation. As another example, a memory map includes a cache linesize of a cache module representation that supports an IP block, anumber of cache lines of the cache module representation, setassociativity of the cache module representation, a cache index hashfunction of the cache module representation, etc. The memory devicemodule representation is used for storing an input or an output of an IPblock. It should be noted that a function of a memory device modulerepresentation is to store an input or an output. The scenario models206 further include one or more driver scenario models, one or moreapplication scenario models, and one or more performance scenariomodels.

In one embodiment, the scenario models 206 include a number of driverscenario models, or a number of application scenario models, or a numberof performance scenario models, or one or more stimulus', or one or moreexpected outputs, or a combination thereof.

In an embodiment, an application scenario model includes a number ofdriver scenario models. As an example, a driver scenario model is amodel of a function that is used with other functions of an applicationscenario model. In one embodiment, a performance scenario model includesa number of driver scenario models.

In an embodiment, a scenario model that is of a lower level than ahigher level model provides randomized services to the higher levelmodel and the higher level model applies a number of constraints to thelower level models. For example, an output of an application scenariomodel applies a constraint on a driver scenario model, which is includedwithin the application scenario model. In this example, the driverscenario model is not executed or is executed based on limited datavalues as a result of the constraint. As yet another example, aperformance scenario model is at a higher level than an applicationscenario mode, which is at a higher level than a driver scenario model.

When one or more scenario models are generated before a test thatapplies the scenario models is executed using a test bench, constraintsassociated with a driver scenario model are generated before the test isexecuted. This prior generation of scenario models and of constraintsyields tests that are individual, light-weight, repeatable, and simpleto debug.

In an embodiment, one of the scenario models 206 includes obtaining aresponse from an IP block that is powered down or disabled. The IP blockis powered down when the IP block is not provided power by a system andpower control module representation, which is further described below.

The test file generation module 110 receives the scenario models 206 ina compiled file and parses the compiled file to generate one or moretest files 208. For example, the test files 208 include a test file208A, a test file 208B, and a test file 208C. Each test file 208A, 208B,and 208C includes a scenario model. For example, the test file 208Astores one of the scenario models 206, the test file 208B stores anotherone of the scenario models 206, and the test file 208C stores yetanother one of the scenario models 206.

In one embodiment, a test file includes any number, e.g., one, two,three, etc. of scenario models, etc.

In an embodiment, an event file, further described below, includes anumber of expected outputs associated with the number of scenariomodels.

A hierarchy of the lower and higher levels of the scenario models 206 isused by the test file generation module 110 for generation of the one ormore test files 208. For example, one test file stores a driver scenariomodel and another test file stores an application scenario model thatincludes the driver scenario model. As another example, one test filestores a performance scenario model and another test file stores anapplication scenario model.

In one embodiment, a first test file generated by the test filegeneration module 110 is compiled by a first compiler executed by theprocessor 101 and a second test file generated by the test filegeneration module 110 is compiled by a second compiler executed by theprocessor 101 or by another processor. For example, the first test fileis compiled by a compiler of the processor 101 simultaneous with orsequential to compiling of the second test file by another compiler ofthe processor 101. The compilation of each of the test files 208 by adifferent compiler is for a design of the SoC in which multipleprocessors are used. One of the multiple processors executes a functionof or within a scenario model that is stored in the first test file andcompiled by the first compiler and another one of the multipleprocessors executes a function of or within another scenario model thatis stored in the second test file and compiled by the second compiler.

Examples of the one or more test files 208 include a C file and a C++file. Other examples of the one or more test files 208 include a Fortranfile, an Assembly language file, a distribution application specificlanguage (DASL) file, a D file, an objective-C file, etc., to name afew. It should be noted that in one embodiment, the one or more testfiles 208 are generated in any other programming language.

In one embodiment, each of the one or more test files 208 is executedrandomly by the processor 101 as a micro-kernel running randomizedapplications, e.g., driver scenario models, etc. Each of the one or moretest files 208 when executed randomly calls a number of driver scenariomodels that is a portion of an application scenario model or aperformance scenario model.

In one embodiment, each test file 208A, 208B, and 208C stores adifferent type of scenario model. For example, the test file 208A storesan application scenario model, the test file 208B stores a driverscenario model, and the test file 208C stores a performance scenariomodel. In an embodiment, each test file stores the same type of scenariomodels. For example, the test file 208A stores an application scenariomodel, the test file 208B stores another application scenario model, andthe test file 208C stores yet another application scenario model.

Moreover, the test file generation module 110 parses the compiled filethat includes the scenario models 206 to generate one or more eventsfiles 210, e.g., an event file 210A, an event file 210B, and an eventfile 210C. Each of the event files 210 includes a number of expectedoutputs. For example, the event file 210A includes an expected outputfor the same type of a scenario model as that of the event files 210Band 210C. To illustrate, the event file 210A includes an expected outputof an application scenario model, the event file 210B includes anexpected output for another application scenario model, and the eventfile 210C includes an expected output for yet another applicationscenario model. As another illustration, the event file 210A includes anexpected output of a driver scenario model, the event file 210B includesan expected output for another driver scenario model, and the event file210C includes an expected output for yet another driver scenario model.As another example, the event file 210A includes an expected output fora different type of scenario model than that of the event files 210B and210C. To illustrate, the event file 210A includes an expected output ofan application scenario model, the event file 210B includes an expectedoutput for a driver scenario model. As another illustration, the eventfile 210A includes an expected output of a driver scenario model and theevent file 210C includes an expected output for a performance scenariomodel.

Each event file is associated with a corresponding test file. Forexample, the event file 210A stores an expected output of a scenariomodel that is stored within the test file 208A, the event file 210Bstores an expected output of a scenario model that is stored within thetest file 208B, and the event file 210C stores an expected output of ascenario model that is stored within the test file 208C.

In an embodiment, an event file is associated with multiple test files.For example, the event file 210A stores an expected output of a scenariomodel that is stored within the test file 208A, stores an expectedoutput of a scenario model that is stored within the test file 208B, andstores an expected output of a scenario model that is stored within thetest file 208C.

In one embodiment, each event file includes a number of eventidentifications (IDs), which are further explained below.

The test files 208 are compiled by a compiler 212 to generate one ormore compiled files. The compiler 212 is executed by the processor 101.In an embodiment, the compiler 212 is executed by a processor other thanthe processor 101. The compiled files are provided by the compiler 212to a test bench 214, which is executed by the processor 101 or byanother processor of a computing device.

In an embodiment, a first one of the test files 208 is compiled by adifferent compiler than a compiler that is used to compile a second oneof the test files 208 to generate compiled files for a test bench of theSoC in which multiple processors are used. A module representation,within the test bench, of one of the processors is used to execute atleast a portion of a scenario model stored within the first one of thetest files 208 and a module representation, within the test bench, ofanother one of the processors is used to execute at least a portion of ascenario model within the second one of the test files 208.

In one embodiment, a test bench, as described herein, is executed by aprocessor other than the processor 101 that generates one or more testfiles. This separation saves a number of CPU cycles of the processor 101used and reduces load on the processor 101. In an embodiment, a memorydevice used to store one or more test files is other than a memorydevice used to store a test bench described herein.

The compiled files that are compiled by the compiler 212 are provided tothe test bench 214 to further execute one or more of the modulerepresentations A, B, C, D, E, F, and G and/or to execute a fabric 216and/or to execute a fabric 218. A number of the module representationsA, B, C, D, E, F, and G executed within the test bench 214 depends onwhether the module representations are designated for execution in theone or more scenario models 206. It should be noted that each fabric 216and 218 includes one or more links between two or more of the modulerepresentations A, B, C, D, E, F, and G. The test bench 214 furtherincludes a number of I/O module representations.

In some embodiments, the test bench 214 is executed by a processor,e.g., a CPU, other than the processor 101. In various embodiments, thetest bench 214 is executed by the processor 101.

A comparator 220 is executed by the processor 101 or by anotherprocessor of a computing device. In one embodiment, the comparator 220is generated using a test programming language, e.g., SystemVeriloglanguage, hardware description layer (HDL) language, etc. The comparator220 receives the events files 210.

In one embodiment, the events files 210 include stimuli. The comparator220 parses the events files 210 to determine the stimuli and providesthe stimuli to one or more I/O module representations of the test bench214. For example, the comparator 220 provides the stimuli to one or moreI/O module representations 222A and 222C of the test bench.

In an embodiment, each test file 208A, 208B, and 208C includes astimulus for testing an SoC or a design of the SoC. For example, thetest file 208A includes a stimulus for providing to a first scenariomodel, the test file 208B includes a stimulus for providing to a secondscenario model, and the test file 208C includes a stimulus for providingto a third scenario model.

Upon receiving stimuli from the comparator 220 or from the compiled filethat is received from the compiler 212, the test bench 214 executes oneor more scenario models to generate a number of test outputs. Forexample, as illustrated using a dashed line in the test bench 214, thetest bench 214 forward propagates a stimulus from an input node of amodule representation A and applies a function of the modulerepresentation A to the stimulus to generate an output at an output nodeof the module representation A. The dashed line provided a direction ofexecution of a path. The stimulus is received from the comparator 220.The output at the output node of the module representation A is forwardpropagated by the test bench 214 via the fabric 216 to an input node ofa module representation D. The test bench 214 applies a function of themodule representation D to the output receive at the input node of themodule representation D to generate an output at an output node of themodule representation D. The test bench 214 forward propagates theoutput at the output node of the module representation D via a link toan input node of a module representation E. The test bench 214 furtherapplies a function of the module representation E to the output receivedat the input node of the module representation E to generate an outputat an output node of the module representation E. The output at theoutput node is forward propagated by the test bench 214 via the fabrics218 and 216 to an input node of a module representation B.

Continuing with the example, the test bench 214 applies a function ofthe module representation B to the output received at the input node ofthe module representation B to generate an output at an output node ofthe module representation B. The test bench 214 also forward propagatesthe output at the output node of the module representation B via a linkto an input node of a module representation C. Thereafter, the testbench 214 applies a function of the module representation C to theoutput received at the input node of the module representation C togenerate an output at an output node of the module representation C. Theoutput at the output node of the module representation C is forwardpropagated by the test bench 214 via the fabrics 216 and 218 to an inputnode of a module representation F. The test bench 214 applies a functionof the module representation F to the output received at the input nodeof the module representation F to generate an output at an output nodeof the module representation F. The output at the output node F isforward propagated as a test output by the test bench 214 via the I/Omodule representation 222C to the comparator 220.

As another example, as illustrated using a dotted line in the test bench214, the test bench 214 forward propagates a stimulus from an input nodeof the module representation E and applies a function of the modulerepresentation E to the stimulus to generate an output at an output nodeof the module representation E. The dotted line provides a direction ofexecution of a path. The stimulus is received from the comparator 220.The output at the output node of the module representation E is forwardpropagated by the test bench 214 via the fabrics 216 and 218 to an inputnode of the module representation B. The test bench 214 applies afunction of the module representation B to the output received at theinput node of the module representation B to generate an output at anoutput node of the module representation B. The test bench 214 forwardpropagates the output at the output node of the module representation Bvia a link to an input node of the module representation C. The testbench 214 further applies a function of the module representation C tothe output received at the input node of the module representation C togenerate an output at an output node of the module representation C.

Continuing with the example, the output at the output node of the modulerepresentation C is forward propagated by the test bench 214 via thefabrics 216 and 218 to an input node of the module representation F. Thetest bench 214 applies a function of the module representation F to theoutput receive at the input node of the module representation F togenerate an output at an output node of the module representation F. Theoutput at the output node F is forward propagated as a test output bythe test bench 214 via the I/O module representation 222C to thecomparator 220.

It should be noted that in one embodiment, as indicated by the dashedline in FIG. 2A-2 , the forward propagation from the modulerepresentation A via the module representations D, E, B, C, and F is anexample of a first performance scenario model or an application scenariomodel. In this embodiment, as indicated by the dotted line in FIG. 2A-2, the forward propagation from the module representation E via themodule representations B and C to the module representation F is anexample of a second performance scenario model or an applicationscenario model.

The comparator 220 compares the test outputs received from the I/Omodule representation 222C with corresponding expected outputs that areparsed by the comparator 220 from the events files 210 to generate aresult, e.g., test fail, test pass, etc. For example, upon determiningthat a first one of the test outputs received from the I/O modulerepresentation 222C matches the expected output of the event file 210Aor are within a corresponding pre-determined threshold of the expectedoutput and upon determining that a second one of the test outputsreceived from the I/O module representation 222C matches an expectedoutput within the event file 210B or are within a correspondingpre-determined threshold of the corresponding expected output, thecomparator 220 determines that both the first and second performancescenario models passed a test. On the other hand, upon determining thatthe first test output does not match or is not within the pre-determinedthreshold of the expected output of the event file 210A, the comparator220 determines that the first performance scenario model failed a testand upon determining that the second test output does not match or isnot within the pre-determined threshold of the expected output of theevent file 210B, the comparator 220 determines that the secondperformance scenario model failed a test.

In an embodiment, when both the first and second performance scenariomodels pass a test, the SoC scenario models 206 pass a test. In oneembodiment, when one or both the first and second performance scenariomodels fail a test, the SoC scenario models 206 fail a test.

In one embodiment, a test output corresponds to an expected output whenboth the test output and the expected output have an event ID. Forexample, the test file generation module 110 generates the one or moreevents files 210, which include event IDs for each expected output.Also, the test file generation module 110 generates the one or more testfiles 208, which include the event IDs. When a scenario model isexecuted within a test bench, one of the event IDs is generated and thensent with a test output having the event ID to the comparator 220. Thecomparator 220 determines the corresponding expected output when theevent ID received from the test bench matches that of expected output.In an embodiment, each event ID is mapped to a scenario model by theprocessor 101.

In one embodiment, the comparator 220 determines which scenario model toexecute based on an event ID of the scenario model. For example, thecomparator 220 randomly identifies an event ID mapped to a scenariomodel and sends a signal to the test bench including the event ID forexecution of the scenario model in the test bench.

In an embodiment, the comparator 220 is executed by a processor otherthan the processor 101 and/or a processor that executes a test bench.This saves CPU cycles by offloading result checks to the comparator 220.In one embodiment, the one or more events files 210 are stored in amemory device other than a memory device that stores a test bench and/ora memory device that stores the one or more test files 208.

In one embodiment, one or more test files, described herein, store avariety of information e.g., a sequence in which register operations areperformed, a sequence in which IP blocks are driven, memory addressesthat are to be used to perform a test, functions performed by componentsof an SoC to which a test is to be applied, a test bench identifier thatidentifies a test bench used to test the SoC, a manner of loggingmessages regarding passage or failure of the test, a manner of checkingdata, etc.

In one embodiment, a number of test files are generated in a mannerdescribed above for different test benches and for different SoCs. Thegeneration of the test files allows for easy re-use of the test files.

In an embodiment, the SoC scenario models 206 mimic a hierarchy ofservices that are provided by an operating system, e.g., a Linux™operating system, an Android™ operating system, a Windows™ operatingsystem, a Unix operating system, a Chromium™ operating system, an OS X™operating system, etc.

In one embodiment, the comparator 220 generates one or more debugmessages that indicate a result of a comparison between a test outputand an expected output. For example, upon determining that a test outputdoes not match a corresponding expected output, the comparator 220generates a message indicating the same or that a test failed.

In an embodiment, the comparator 220 stores a debug message within oneor more files. For example, the comparator 220 stores a messageindicating that a scenario model of a file failed a test below oradjacent to the scenario model.

In one embodiment, a comparison performed by the comparator 220 isperformed by the test bench 214 instead of by the comparator 220. Inthis embodiment, expected outputs that are within the events files 210are instead stored within the test files 208. For example, an expectedoutput of a scenario model is stored within the test file 208A thatincludes the scenario model. As another example, an expected output of ascenario model is stored within the test file 208B that includes thescenario model.

In one embodiment, the SoC scenario models 206 include memory allocationof one or more memory devices or of one or more memory device modulerepresentations. For example, when data is accessed from a memory devicemodule representation and/or is written to a memory device modulerepresentation and a limited number of memory device modulerepresentations are available for use with the SoC scenario models 206,one or more of the memory device module representations are assigned toan IP block for writing data or for reading data.

In an embodiment, the SoC scenario models 206 include handling ofinterrupts. For example, when a first one of the SoC scenario models 206is being executed, a second one of the SoC scenario models 206interrupts the first SoC scenario model. The processor 101 executes thesecond SOC scenario model before finishing execution of the first SOCscenario model.

In one embodiment, the first SoC scenario model is executed by a firstprocessor, e.g., the processor 101, and the second SoC scenario model isexecuted by a second processor of the computing device.

In an embodiment, a first computer thread executed by the processor 101includes the first SoC scenario model and a second computer threadexecuted by the processor 101 includes the second SoC scenario model.

In one embodiment, the SoC scenario models 206 include management ofI/Os and I/O module representations. For example, an I/O modulerepresentation is used to transfer test output and/or expected output.When a limited number of I/O module representations is available for usewith the SoC scenario models 206, the I/O module representations aremanaged based on a time of transfer of outputs. To further illustrate, amodule representation waits to use an I/O module representation beforeanother module representation completes sending or receiving an outputvia the I/O module representation.

In an embodiment, the SoC scenario models 206 include debugging of anSoC or of modules within a test bench. The debugging is performed basedon a result of a test. For example, when a test fails, the processor 102executes the SoC scenario models 206 to debug a module within a testbench. The debugging is performed to fix the module to furtherfacilitate passing of the test by the module.

In an embodiment, one of the event files 210 stores an expected outputof a scenario model and one of the test files 208 stores the scenariomodel. In this embodiment, another one of the event files 210 storesanother expected output of another scenario model and another one of thetest files 208 stores the other scenario model.

In some embodiments, the test file generation module 110 and thecompiler 212 are executed by a processor that executes the test bench214. For example, instead of the processor 101 executing the test filegeneration module 110 and another processor executing the compiler 212,both the test file generator module 110 and the compiler 212 areexecuted by a processor that executes the test bench 214.

It should be noted that in one embodiment, the test file generationmodule 110 is executed by a processor, the compiler 212 is executed byanother processor, and the test bench 214 is executed by yet anotherprocessor.

FIG. 2B-1 is a diagram of an embodiment of a system 250 to illustrate anexample of the test bench 214 of FIG. 2A-2 . The system 250 is similarto the system 200 of FIGS. 2A-1 and 2A-2 except that the system 250includes a universal verification methodology (UVM) test bench 252,which is an example of the test bench 214 (FIG. 2A-2 ). The UVM testbench 252 is a register transfer level (RTL) abstraction that isgenerated using the test programming language. UVM is a methodology forverifying designs of integrated circuit (IC) chips. In an embodiment,UVM includes a library that brings automation to a SystemVeriloglanguage, such as, sequences and data automation features. Examples ofthe data automation features include packing, copying, comparing, etc.

The UVM test bench 252 includes module representations 254, which areexamples of module representations of components of a digital camera.The module representations 254 include a CPU module representation, amemory device module representation, an image processor modulerepresentation, a camera module representation, a display controllermodule representation, and a secure digital (SD) card modulerepresentation. The module representations 254 further include fabrics216 and 218, and a system and power control module representation. Thesystem and power control module representation provides power to theimage processor module representation, the memory device modulerepresentation, the CPU module representation, the SD card controllermodule representation, the display controller module representation, andthe camera module representation, and manages the provision of power. Itshould be noted that the CPU module representation is an example of themodule representation A (FIG. 2A-2 ), the memory device modulerepresentation is an example of the module representation B (FIG. 2A-2), the image processor module representation is an example of the modulerepresentation C (FIG. 2A-2 ), the camera module representation is anexample of the module representation D (FIG. 2A-2 ), the displaycontroller module representation is an example of the modulerepresentation E (FIGS. 2A-2 ), the SD card module representation is anexample of the module representation F (FIGS. 2A-2 ), and the system andpower control module representation is an example of the modulerepresentation G (FIG. 2A-2 ).

In an embodiment, a module representation includes sub-modulerepresentations and sub-links between the sub-module representations.For example, the camera module representation includes ananalog-to-digital (A-to-D) converter sub-module representation, a gainamplifier sub-module representation, and a clock sub-modulerepresentation. A digital end of the A-to-D converter sub-modulerepresentation is connected via a sub-module link to the gain amplifiersub-module representation, which is connected via a link to the CPUmodule representation and via another link to the display controllermodule representation. An analog end of the A-to-D converter sub-modulerepresentation is connected via a sub-link to a charge-coupled device(CCD). Moreover, the clock sub-module representation is connected via alink to the CCD to provide a clock signal to the CCD. The CCD convertslight energy, e.g., photons, etc., into electrical energy, e.g.,electrons, etc. The A-to-D converter performs a function of convertinganalog data that is received from the CCD into a digital signal thatincludes digital data. The gain amplifier sub-module representationperforms a function of amplifying a magnitude of the digital signal. Inan embodiment, the clock sub-module representation performs functions ofgenerating and providing a clock signal to the camera modulerepresentation and/or to other module representations that are connectedto the camera module representation.

In one embodiment, the comparator 220 is connected to one or more of themodule representations A, B, C, D, E, F, and G (FIG. 2A-2 ) that arebeing executed within a test bench to provide one or more stimulus' tothe one or more module representations and/or to receive one or moretest results from the one or more module representations. For example,the comparator 220 is connected to the processor module representation,and/or the memory device module representation, and/or the CPU modulerepresentation, and/or the SD card controller module representation, orthe display controller module representation, and/or the camera modulerepresentation, and/or the system and power control modulerepresentation. To further illustrate, a test file includes a scenariomodel to be executed by one or more module representations of a testbench. The one or more module representations of the test bench areprogrammed to perform a function. The function indicates that the one ormore module representations provide a signal to the comparator 220 toreceive data from the comparator 220. Upon receiving the signal, thecomparator 220 provides the data to the one or more modulerepresentations of the test bench connected to the comparator 220 tofacilitate execution of the scenario model within the test bench. Thescenario model is executed to test the one or more modulerepresentations. The comparator 220 receives a test output generated bythe module representations based on the scenario model within a testfile and compares the test output with an expected output.

In an embodiment, the comparator 220 receives the test output from amemory location of a memory device of the computing device. The testoutput is stored in the memory location by one or more modulerepresentations of the test bench. A processor that executes the testbench is coupled to the memory device.

In one embodiment the comparator 220 receives the test output from amemory queue of one or more memory devices of the computing device. Thetest output is stored in the memory queue by one or more modulerepresentations of the test bench. To illustrate, during an emulationstage of a project, which is further described below, the comparator 220requests, at pre-determined intervals, a processor executing the testbench to pause execution of the test bench to read the test output fromthe memory queue at the pre-determined intervals. The processor thatexecutes the test bench is coupled to the one or more memory deviceshaving the memory queue.

In an embodiment, the comparator 220 receives the test output from amemory queue within an I/O interface, e.g., a UART, etc., between thecomparator 220 and a processor that executes the test bench. The testoutput is stored within the memory queue of the I/O interface by one ormore module representations of the test bench. The processor thatexecutes the test bench is coupled to the I/O interface.

In one embodiment, the comparator 220 receives the test output, e.g.,messages, etc., from a log file stored in a memory device that iscoupled to a processor executing the test bench. The test output isstored in the log file by one or more module representations of the testbench. The test output is post-processed by the comparator 220 afterexecution of the test bench is completed to generate the test output.The processor that executes the test bench is coupled to the memorydevice.

FIG. 2B-2 is a diagram of an embodiment of the UVM test bench 252 toillustrate multiple application scenario models. One of the applicationscenario models is illustrated in dashed lines in FIG. 2B-2 . Theapplication scenario model is of storing an image that is displayed on adisplay device into an SD card. As shown by the dashed lines, an imagefrom the display device is read by the display controller modulerepresentation via an I/O module representation to generate image data.The image data is sent by the display controller module representationvia the fabrics 218 and 216 to the memory device module representationfor storage. The image processor module representation retrieves theimage data stored in the memory device module representation andprocesses, e.g., encodes, etc., the image data to generate encoded imagedata. The encoded image data is sent from the image processor modulerepresentation via the fabrics 216 and 218 to the SD card controllermodule representation. The SD card controller module representationwrites the encoded image data to the SD card via an I/O modulerepresentation.

Moreover, another one of the application scenario models is illustratedby solid lines. The application scenario model is that of retrieving animage from the SD card to display on the display device. The SD cardcontroller module representation reads via an I/O module representationthe encoded image data that is stored in the SD card. The SD cardcontroller module representation sends the encoded image data to theimage processor module representation via the fabrics 216 and 218. Theimage processor module representation decodes the encoded image data andprovides the decoded image data to the memory device modulerepresentation for storage. The display controller module representationreads the decoded image data from the memory device modulerepresentation via the fabrics 216 and 218 and sends the decoded imagedata via an I/O module representation to the display device. The displaydevice receives the decoded image data and renders the decoded imagedata for displaying an image.

FIG. 2B-3 is a diagram of an embodiment of a graph 260 to illustratemultiple application scenario models. A first one of the applicationscenario models is reading encoded image data from an SD card anddecoding the encoded image data for display of an image on a displaydevice. An SD card controller module representation reads the encodedimage data from the SD card and provides the encoded image data to animage processor module representation. The image processor modulerepresentation decodes the encoded image data to generate decoded imagedata. A display controller module accesses the decoded image data fromthe image processor module representation and sends the decoded imagedata to the display device for display of an image.

A second one of the application scenario models is reading the encodedimage data from the SD card for display of an encoded image on thedisplay device. In one embodiment, instead of reading the encoded imagedata, decoded image data that is stored in the SD card is read. The SDcard controller module representation reads the encoded image data fromthe SD card. The display controller obtains the encoded image data fromthe SD card controller module representation and provides the encodedimage data to the display device for display of the encoded image on thedisplay device.

A third one of the application scenario models is capturing image dataand encoding the image data for storage in an SD card. A CCD capturesimage data by converting photons into electrons. A camera modulerepresentation processes, e.g., converts from an analog form into adigital form, provides a gain, etc., to the image data that is capturedand provides the processed image data to the image processor modulerepresentation. The image processor module representation encodes theprocessed image data to generate encoded image data. The SD cardcontroller module representation obtains the encoded image data from theimage processor module representation and writes the encoded image datato the SD card.

A fourth one of the application scenario models is capturing image dataand storing the image data. The CCD module representation captures theimage data. The camera module representation processes the image datathat is captured to generate processed image data. The SD cardcontroller module representation obtains the processed image data fromthe camera module representation and writes the processed image data tothe SD card.

A fifth one of the application scenario models is capturing image dataand displaying the image data. The CCD module representation capturesthe image data. The camera module representation processes the imagedata that is captured to generate processed image data. The displaycontroller module representation accesses the processed image data fromthe camera module representation and displays the processed image dataas an image on the display device.

FIG. 2B-4 is a diagram of an embodiment of a graph 270 to illustrate anapplication scenario of power management. The system and power controlmodule representation is an IP block that manages two power domains, D0and D1. The power domain DO includes providing or removing power fromthe camera module representation. Moreover, the power domain D1 includesproviding or removing power from the image processor modulerepresentation, the SD card controller module representation, and/or thedisplay controller module representation.

The power management application scenario is generated by the processor101 based on a use application scenario to be tested by the UVM testbench 252 (FIG. 2B-2 ). For example, upon determining by the processor101 that the use application scenario does not involve using the cameramodule representation, the processor 101 determines that power is not tobe provided by the system and power control module representation to thecamera module representation. The provision of power to the cameramodule representation is not made a part of the power managementapplication scenario by the processor 101. Moreover, the processor 101determines that the use application scenario involves decoding imageddata or encoding image data, or reading image data from the SD card orwriting image data to the SD card, or displaying an image. Upondetermining that the use application scenario involves decoding imageddata or encoding image data, the processor 101 determines that the powermanagement application scenario involves provision of power by thesystem and power control module representation to the image processormodule representation. Similarly, upon determining that the useapplication scenario involves reading image data from the SD card orwriting image data to the SD card, the processor 101 determines that thepower management application scenario involves provision of power by thesystem and power control module representation to the SD card controllermodule representation. Moreover, upon determining that the useapplication scenario involves displaying an image, the processor 101determines that the power management application scenario involvesprovision of power by the system and power control module representationto the display controller module representation.

FIG. 3 is a diagram of an embodiment of a system 300 to illustrate useof driver scenario models (DSMs) 302A, 302B, 302C, 302D, 302E, and 302F,and use of an application scenario model 304. The driver scenario model302A is executed within the module representation A, the driver scenariomodel 302B is executed within the module representation D, the driverscenario model 302C is executed within the module representation E, thedriver scenario model 302D is executed within the module representationB, the driver scenario model 302E is executed within the modulerepresentation C, and the driver scenario model 302F is executed withinthe module representation F. Each driver scenario model 302A, 302B,302C, 302D, 302E, or 302F includes one or more sub-modulerepresentations. For example, the driver scenario model 302A includes asub-module representation 308A, a sub-module representation 308B, asub-module representation 308C, and a sub-module representation 308D.When a driver scenario model includes multiple sub-modulerepresentations, the driver scenario model includes sub-links betweenthe sub-module representations. For example, a sub-link 310A connectsthe sub-module representation 308A to the sub-module representation 308Band a sub-link 310B connects the sub-module representation 308A to thesub-module representation 308D. An example of a sub-modulerepresentation includes a decision making sub-module representation thatis executed by the processor 101 to make a decision between a number ofchoices. Another example of a sub-module representation includes achoice made after a decision.

The application scenario model 304 includes the driver scenario models302A, 302B, 302C, 302D, 302E, and 302F and links between the driverscenario models. For example, the application scenario model 304includes the driver scenario models 302A, 302B, 302C, 302D, 302E, and302F, a link between the model 302A and the model 302B, a link betweenthe model 302B and the model 302C, a link between the model 302C and themodel 302D, a link between the model 302D and the model 304E, and a linkbetween the model 302E and the model 302F.

It should be noted that the sub-module representation 308A receives anexpected output at an output node of the driver scenario model 302A. Thesub-module representation 308A is executed by the processor 101 togenerate an intermediate output to be provided to the sub-modulerepresentation 308B for further processing and to generate anotherintermediate output to be provided to the sub-module representation 308Dfor further processing. In this manner, the expected output at theoutput node of the driver scenario model 302A is back propagated via thedriver scenario model 302A to generate one or more test inputs at one ormore input nodes of the driver scenario model 302A. The test input todriver scenario model 302A is the expected output of driver scenariomodel 302B. The expected outputs are provided to a sub-modulerepresentation 312A of the driver scenario model 302B for furtherprocessing and back propagation. In this manner the expected output atthe output node of the driver scenario model 302A is propagated via thedriver scenario models 302B, 302C, 302D, 302E, and 302F to generate oneor more test inputs at one or more input nodes of the driver scenariomodel 302F.

It should further be noted that the module representations B, C, D, E,F, and G of the UVM test bench 214 and connections between the modulerepresentations form a group 350.

The application scenario model 304 is a part of an SoC scenario model314, which is an example of one of the SoC scenario models 206 (FIG.2A-2 ).

FIG. 4-1 is a diagram of an embodiment of a system 400 to illustratehorizontal and vertical integration of an SoC scenario model 402 invarious stages of the project of developing a post-silicon SoC. Thehorizontal and/or vertical integration allows for an increase in areturn on investment from generating the SoC scenario models 206 (FIG.2B-1 ). The SoC scenario model 402 is an example of one of the SoCscenario models 206. The SoC scenario model 402 includes a driverscenario model 404. In one embodiment, the driver scenario model 404 isnot a portion of the SoC scenario model 402.

The test file generation module 110 identifies the driver scenario model404 from a compiled file and provides the driver scenario model 404 to aUVM test bench 406. The UVM test bench 406 includes an IP block that iscoupled to an I/O module representation 408 and to another I/O modulerepresentation 410. It should be noted that in one embodiment, an I/O IPblock is a bus verification intellectual property (VIP). In anembodiment, a VIP provides an abstraction of a stimulus and monitoringused to verify functioning, e.g., operability, etc., of a modulerepresentation. Each of the module representations A, B, C, D, E, F, andG (FIG. 3 ) is an example of the IP block.

In one embodiment, instead of providing the driver scenario model 404 tothe UVM test bench 406, the test file generation module 110 generates afile that includes the driver scenario model 404 and the file iscompiled to generate a compiled file. The compiled file is provided tothe UVM test bench 406 for execution.

The IP block is tested in the UVM test bench 406 when the processor 101applies the driver scenario model 404 to the UVM test bench 406. Forexample, a stimulus is provided to the IP block via the I/O modulerepresentation 410. The UVM test bench 408 is executed by the processor101 to apply a function of the IP block to the stimulus to generate atest output. The test output is retrieved via the I/O modulerepresentation 408 and compared with an expected output to determinewhether the IP block passed a test. The UVM test bench 406 is executedby the processor 101 for testing the driver scenario model 404 at an IPstage of the project.

In one embodiment, the scenario model 404 is a portion of the scenariomodel 402 and is extracted by the test file generation module 110 fromthe scenario model 402.

The SoC scenario model 402 is identified from a compiled file by thetest file generation module 110 and is provided by the test filegeneration module 110 to a UVM test bench 412. The UVM test bench 412 issimilar to the test bench 214 (FIG. 2A-2 ) except that in the UVM testbench 412 the CPU module representation 214 is replaced with a bus VIP.In one embodiment, the bus VIP 420 is less costly to build than the CPUmodule representation of the UVM test bench 214. Also, the bus VIP 420allows for greater throughput, faster simulation, and easier debug thanthat allowed by the CPU module representation 214.

In one embodiment, instead of providing the SoC scenario model 402 tothe UVM test bench 412, the SoC scenario model 402 is identified from acompiled file by the test file generation module 110 to generate a testfile and the test file is compiled by a compiler to generate a compiledfile. The compiled file generated from the test file is provided by thecompiler to the UVM test bench 412.

In an embodiment, a bus VIP and a bus functional module (BFM) are usedinterchangeably herein.

In an embodiment, the bus VIP 420 provides a lesser amount offunctionality compared to that of the CPU module representation in theUVM test bench 214 and the bus VIP 420 is easier to construct and usecompared to construction and use of the CPU module representation. Thebus VIP 420 is connected to the module representation B and to thefabric 216.

The SoC scenario model 402 identified from a compiled file by the testfile generation module 110 and provided to the UVM test bench 412 isalso provided to the test bench 214. It should be noted that the UVMtest bench 412 is applied to the SoC scenario model 402 at a subsystemstage of the project and the UVM test bench 214 is applied to the SoCscenario model 402 at an SoC stage of the project. It should be notedthat the IP, the subsystem, and the SoC stages are simulation stages ofthe project.

In one embodiment, instead of providing the SoC scenario model 402 tothe UVM test bench 214, the compiled file generated based on the testfile that is created by the test file generation module 110 and providedto the UVM test bench 412 is also provided to the test bench 214.

The vertical integration is provided when the same driver scenario model404 is applied at the IP, subsystem and SoC levels of the project.Moreover, the vertical integration is provided when the same SoCscenario model 402 is applied at the subsystem and SoC levels of theproject.

Also, the SoC scenario model 402 is identified from a compiled file by atest file generation module 452, and the SoC scenario model 402 isprovided by the test file generation module 452 to an emulator of thepost-silicon SoC. The test file generation module 452 is executed by theprocessor 101 or by another processor. The emulator is tested using theSoC scenario model 402.

In one embodiment, instead of providing the SoC scenario model 402 tothe emulator, the compiled file that includes the SoC scenario model 402is parsed by a test file generation module 452 to generate a test file,and the test file is compiled by the test file generation module 452 togenerate a compiled file. The compiled file generated from the test fileis provided to the emulator of the post-silicon SoC

In one embodiment, the emulator is a hardware, e.g., silicon chip,silicon chip with integrated circuits, etc., or software or both thatduplicates the functions of the post-silicon SoC. When the emulator ishardware, it is controlled by the processor 101 or by another processor.In this embodiment, a behavior of the emulator closely resembles that ofthe post-silicon SoC. The testing of the emulator is performed using theSoC scenario model 402 at the emulation stage of the project.

Moreover, the scenario model 402 that is identified by the test filegeneration module 452 from a compiled file is provided by the processor101 to a prototype of the post-silicon SoC. In one embodiment, theprototype of the post-silicon SoC is more customized to the post-siliconSoC than the emulator. For example, the emulator is commerciallyavailable and has a limited number of sizes of memory devices and thepost-silicon SoC is built in a lab with a higher variety of sizes ofmemory devices. As another example, the emulator has buses that have alimited number of speeds of transfer of data and the prototype includescustom designed buses that operate at a higher number of speeds of datatransfer. The prototype is tested using the same scenario model 402 usedto test the emulator. The testing of the prototype using the SoCscenario model 402 is performed at a prototyping stage of the project.In an embodiment, during the prototyping stage, instead of theprototype, the post-silicon SoC is used directly to enable the user totest the post-silicon SoC at a real-world operating frequency of thepost-silicon SoC with real-world stimulus.

Furthermore, the SoC scenario model 402 used to test the emulator andthe prototype is also used to test the post-silicon SoC. The testing ofthe post-silicon SoC is performed using the SoC scenario model 402 at apost-silicon stage of the project.

In one embodiment, instead of providing the SoC scenario model 402 tothe prototype of the post-silicon SoC, the compiled file that includesthe SoC scenario model 402 is parsed by the test file generation module452 to generate a test file, and the test file is compiled by the testfile generation module 452 to generate a compiled file. The compiledfile generated from the test file is provided to the prototype of thepost-silicon SoC.

In an embodiment, instead of providing the SoC scenario model 402 to thepost-silicon SoC, the compiled file that includes the SoC scenario model402 is parsed by the test file generation module 452 to generate a testfile, and the test file is compiled by the test file generation module452 to generate a compiled file. The compiled file generated from thetest file is provided to the post-silicon SoC. In one embodiment, ascenario model that is used to test the emulator, the prototype, and thepost-silicon SoC is similar to a scenario model that is applied to theUVM test bench 214 and to the UVM test bench 412 except that thescenario model for the emulator, the prototype, and the post-silicon SoCexcludes expected outputs. The expected outputs are stored within amemory device of the emulator, or the prototype, or the SoC. In thisembodiment, the emulator is made of hardware or a combination ofhardware and software.

In one embodiment, a scenario model that is used to test the UVM testbench 214, the emulator, the prototype, and the post-silicon SoC isstored within a different test file for provision to each of the UVMtest bench 214, the emulator, the prototype, and the post-silicon SoC.For example, the SoC scenario model 402 is stored within a test filethat is provided to the UVM test bench 214, the SoC scenario model 402is stored within another test file that is provided to test theemulator, the SoC scenario model 402 is stored within yet another testfile that is provided to test the prototype, and the SoC scenario model402 is stored within still another test file that is provided to testthe post-silicon SoC.

The horizontal integration is provided when the SoC scenario model 402is used to test the emulator, the prototype, and the post-silicon SoC,and the UVM test bench 214.

It should be noted that in one embodiment, a re-use of SoC scenariomodels at various stages of the project results in a structured approachto SoC function verification. For example, each component of an SoC isindividually tested and tested in conjunction with use of othercomponents of the SoC. To further illustrate, when each driver scenariomodel is individually tested, each component of an SoC is individuallytested at a software level, and when each application scenario model istested, use of the component with one or more of remaining components ofthe SoC is tested at a software level.

In one embodiment, the SoC scenario model 402 includes a modulerepresentation of a processing function of a CPU, and the processingfunction is performed by the bus VIP 420 of the test bench 412 or by theCPU module representation of the test bench 214.

In an embodiment, the same direction of execution of a path is usedwithin both the UVM test bench 412 and the UVM test bench 214. Forexample, a direction of execution of a path that is shown by the dashedline in FIG. 2A-2 is used in both the UVM test bench 412 and the UVMtest bench 214.

In one embodiment, a test file is not generated by the test filegeneration module 110 and is not provided to a UVM test bench, e.g., theUVM test bench 412, the UVM test bench 454, etc. A VIP, e.g., bus VIP420, I/O VIP, etc., of the UVM test bench is not able to execute acomputer program, e.g., a scenario model, etc., but is able to followinstructions, e.g., Assembly language instructions, etc. Theinstructions are generated by the test file generation module 110 basedon a scenario model. For example, an instruction includes reading aregister, writing to a register, reading from a memory address, movingdata, jumping to a memory address, initiating a variable, resetting aregister, enabling a module representation, disabling a modulerepresentation, changing a configuration of a module representation,changing a configuration of a sub-module representation, changing amanner in which a sub-module representation completes execution of itsfunction, etc. To further illustrate, an instruction includes a functionof a sub-module representation. The instructions are received from thetest file generation module 110 by the VIP of the UVM test bench.Moreover, the test file generation module 110 does not generate an eventfile for providing to the UVM test bench. The VIP of the UVM test benchexecutes the instructions to generate a test result. The test result isreceived from the VIP by the test file generation module 110 and acomparison of the test result with an expected output is performed bythe test file generation module 110 to determine whether an SoC passed atest based on a scenario model. The scenario model is constructed basedon the SoC.

Comparatively, in one embodiment, a CPU of the UVM test bench 214receives a compiled file that includes the scenario model and executesthe scenario model to generate a test output. The test output iscompared by the comparator 220 with an expected output of one of theevents files 210 to determine whether the SoC passed a test.

FIG. 4-2 is a diagram of an embodiment of a system 450 to illustratemulti-level design support. An SOC scenario model 453 is generated. TheSoC scenario model 453 is an example of one of the SoC scenario models206 (FIG. 2B-1 ). The SoC scenario model 453 includes a driver scenariomodel that further includes use of the C module representation andfurther includes use of the remaining module representations A, B, E, F,G, and H.

The SoC scenario model 453 is provided within a compiled file to thetest file generation module 110. The test file generation module 110parses the compiled file to generate a test file having the driverscenario model that includes use of the C module representation and thetest file is compiled to test the driver scenario model in a UVM testbench 454, which is an example of the UVM test bench 406 (FIG. 4-1 ).The test file excludes the remaining module representations A, B, E, F,G, and H.

In one embodiment, the test file generation module 110 parses thecompiled file to identify a scenario model, which is provided to the UVMtest bench 454 for testing without generating a test file including thescenario model.

The test file that stores the scenario model 453 is compiled by acompiler. The compiled test file is provided by the compiler to the UVMtest bench 412 for applying the scenario model 453.

In one embodiment, instead of the compiled test file, the scenario model453 is provided by the test file generation module 110 to the UVM testbench 412 for applying the scenario model 453.

Moreover, the same compiled file that is provided to the UVM test bench412 is provided to the UVM test bench 214. Furthermore, the one or moreevents files 210 are generated by the test file generation module 110from the scenario model 453. One or more test outputs generated from theUVM test bench 214 are compared by the comparator 220 to correspondingone or more expected outputs to determine whether an SoC passed a test.

It should be noted that the same scenario model 453 is used to generatetest files for different test benches 214, 412, and 454.

In an embodiment, the test file generation module 110 generatesdifferent events files and different test files for different testbenches. For example, the test file generation module 110 generates oneor more test files for the test bench 454 and generates one or more testfiles for the UVM test bench 412. Each test file for the test bench 454includes a scenario model that is executed within the test bench 454.Comparatively, each test file for the UVM test bench 412 includes ascenario model that is executed within the UVM test bench 412. Asanother example, the test file generation module 110 generates one ormore event files for the test bench 454 and generates one or more eventsfiles for the UVM test bench 412. Each events file for the test bench454 includes an expected output for a scenario model that is executedwithin the test bench 454. Comparatively, each events file for the UVMtest bench 412 includes an expected output for a scenario model that isexecuted within the UVM test bench 412.

In one embodiment, the use of the scenario model 453 in the UVM testbench 214 to generate one or more test outputs, which are compared tocorresponding expected outputs, is an application of a performancescenario model. On the other hand, use of the scenario model 453 in theUVM test bench 412 is an application of an application scenario model.It should be noted that in this embodiment, there is no comparison oftest outputs generated using the test bench 412 with expected outputs todetermine whether a performance constraint is achieved.

FIG. 5 is a diagram of an embodiment of a system 500 to illustrate useof the SoC scenario models 206 to test a post-silicon SoC, e.g., an SoC506, etc. The SoC 506 is a hardware chip that includes integratedcircuits, e.g., a CPU, a memory device, an image processor, fabrics, acamera, a display controller, and an SD card controller, etc., arelocated.

In one embodiment, the SoC scenario models 206 are used to test theemulator or the prototype instead of or in addition to testing thepost-silicon SoC. The SoC scenario models 206 are provided to the testfile generation module 452, which generates a test file for each of theSoC scenario models 206. In one embodiment, a test file stores anynumber of scenario models.

The test file generation module 452 generates one or more test files 502and each test file stores one of the SoC scenario models 206 and/or oneor more stimulus' associated with the SoC scenario model. Moreover, thetest file generation module 452 identifies one or more expected outputsfrom the SoC scenario models 206 in a manner similar to that describedabove with reference to FIG. 1A. The test file generation module 452generates one or more events files 504 that include the expected outputsidentified from the SoC scenario models 206. It should be noted that inone embodiment, the test file generation module 452 performs theoperations of concurrent scheduling, memory allocation, interrupthandling, I/O management, debugging, and/or result checking on the SoCscenario models 206 to generate the one or more test files 502 and/orthe one or more events files 504.

The one or more events files 504 are provided by a processor of a hostsystem 505 to the comparator 220, which is also executed by theprocessor of the host system 505. The comparator 220 parses the one ormore events files 504 to identify one or more expected outputs. Examplesof the host system 505 include a desktop computer, a laptop computer, acomputing device, a tablet, a smart phone, a smart television, etc. Inone embodiment, the host system 505 is implemented on a circuit board.

In one embodiment, the compiled file includes one or more stimulus' forstimulating an input node of an integrated circuit of the SoC 506.

The one or more test files 502 are provided to the compiler 212. In oneembodiment, the compiler is executed by the processor of the host system505. In an embodiment, the processor 101 is the processor of the hostsystem 505.

The compiler 212 generates a compiled file from the one or more testfiles 502 and provides the compiled file to an SoC 506. When thecompiled file is downloaded to the SoC 506, the SoC scenario models 206are executed by the processor of the host system 505. The execution ofthe SoC scenario models 206 include applying the one or more stimulus'to one or more input nodes of an integrated circuit of the SoC 506. Theone or more stimulus' are received within the compiled file.

In one embodiment, the one or more stimulus' are received from thecomparator 220 via a debug access 508. In this embodiment, the one ormore stimulus' are included within the one or more events files 504 bythe test file generation module 452.

In an embodiment, the debug access 508 includes one or more I/Os.

In one embodiment, an I/O is an interface that has logic to interpret anaddress of an integrated circuit of the SOC 506 and to interpret anaddress of the comparator 220. In one embodiment, an I/O converts serialdata to parallel data and vice versa.

The application of the SoC scenario models 206 to the SoC 506 generatesone or more test outputs. The one or more test outputs are provided bythe processor of the host system 505 via the debug access 508 to thecomparator 220. The comparator 220 compares the one or more test outputswith corresponding one or more expected outputs to determine whether theSoC 506 passed a test. For example, upon determining that one of thetest outputs does not match or is not within the pre-determinedthreshold of a corresponding one of the expected outputs, the comparator220 determines that the SOC 506 failed the test. As another example,upon determining that one of the test outputs matches a correspondingone of the expected outputs or is within the pre-determined threshold ofa corresponding one of the expected outputs, the comparator 220determines that the SOC 506 passed the test.

It should be noted that in one embodiment, the SOC 506 is locatedoutside the host system 505. For example, the SOC 506 connected to thehost system 505 via a USB port, or a parallel port, or a serial port,etc., of the host system 505.

In one embodiment, the scenario models 206 include concurrentscheduling, e.g., execution, etc., of two or more scenario models. Forexample, the processor 101 concurrently executes two applicationscenario models of the scenario models 206. In an embodiment, thescenario models 206 include concurrent scheduling of two or more driverscenario models. In one embodiment, the scenario models 206 includeconcurrent scheduling of two or more performance scenario models.

In an embodiment, the scenario models 206 include concurrent schedulingof an application scenario model and a driver scenario model. In thisembodiment, execution of the driver scenario is not a part of executionof the application scenario model.

In one embodiment, the scenario models 206 include concurrent schedulingof a performance scenario model and an application scenario model. Inthis embodiment, execution of the application scenario model is not apart of execution of the performance scenario model.

In an embodiment, the scenario models 206 include concurrent schedulingof a performance scenario model and a driver scenario model. In thisembodiment, execution of the driver scenario model is not a part ofexecution of the performance scenario model.

In one embodiment, an application scenario model is similar to aperformance scenario model except that there is no comparison between atest output of the application scenario and an expected output of theapplication scenario model. In an embodiment, a driver scenario modeltests a single integrated circuit and/or a single module representation.

In one embodiment, scheduling is concurrent when scheduling is performedat the same time or substantially at the same time, e.g., within apre-determined time range, etc.

In one embodiment, the comparator 220 is connected to a part of the SoC506 to provide a stimulus to the part and/or to receive a test resultfrom the part. For example, the comparator 220 is connected to the CPU,and/or the memory device, and/or the image processor, and/or thefabrics, and/or the camera, and/or the display controller, and and/orthe SD card controller, or a system and power controller. To furtherillustrate, a test file includes a scenario model to be executed by oneor more parts of the SoC 506. The one or more parts of the SoC 506 areprogrammed by the scenario model to perform one or more correspondingfunctions. The one or more corresponding functions indicate that the oneor more parts provide a signal to the comparator 220 to receive data,e.g., a stimulus, etc., from the comparator 220. Upon receiving thesignal, the comparator 220 provides the data to the one or more parts ofthe SoC 506 connected to the comparator 220 to facilitate execution ofthe scenario model by a test bench, which includes the one or moreparts. The scenario model is executed to test the one or more parts ofthe SoC 506. The comparator 220 receives a test output generated by theone or more parts of the SoC 506 based on the scenario model within atest file and compares the test output with an expected output.

In an embodiment, a test file includes a condition for execution of anarbitrary operation. An example of the condition includes a change in anenvironmental condition, e.g., temperature, pressure, etc., surroundingan SoC. The arbitrary operation is stored within an event file thatcorresponds to the test file. An example of an arbitrary operationincludes an operation that is not executed using a scenario model, whichis stored within the test file. To illustrate, an arbitrary operationincludes generating an indication to disconnect a wire on a circuitboard, or resetting a dual in-line memory module (DIMM) on a circuitboard, etc. The DIMM is an example of an SoC. The arbitrary operation isgenerated from a computer program code that is written by the user.Moreover, the condition within the test file is also generated from acomputer program code that is written by the user. The processor of thehost system 505 determines whether the condition is satisfied. Upondetermining that the condition is satisfied, the arbitrary operation isaccessed by the processor of the host system 505 from the events fileand executed to determine an output. In an embodiment, the output isprovided to the user, e.g., displayed via a display device of the hostsystem 505, via speakers of the host system 505, etc., to indicate tothe user to perform a manual operation, e.g., disconnecting a wire on acircuit board, etc. In one embodiment, the processor of the host system505 sends a signal to the DIMM to reset the DIMM.

FIG. 6 is a diagram of an embodiment of a system 600 for testing an SoC602. The SoC 602 is an example of the SoC 506 (FIG. 5 ). The SoC 602 islocated on a circuit board 604. The circuit board 604 is connected via auniversal asynchronous receiver transmitter (UART) 605 and a first USBport to a computing device 606. In one embodiment, the processor 101 isa processor of the computing device 606.

The circuit board 604 is further connected via an in-circuit emulator608, e.g., a joint test action group (JTAG) emulator, etc., and adebugger interface 610 to a second USB port of the computing device 606.A compiled file that includes the SoC scenario models 206 (FIG. 5 ) isloaded from the computing device 606 to the SoC 602 via the second USBport of the computing device 606, the debugger interface 610 and thein-circuit emulator 608. The SOC 602 is tested using the SoC scenariomodels 206 to generate one or more test outputs. The test outputs areprovided via the UART 605 and the first USB port to the computing device606.

In one embodiment, a compiled file that includes the SoC scenario models206 is loaded from the computing device 606 to the SoC 602 via the firstUSB port and the UART 605.

The test outputs are provided to the comparator 220 (FIG. 5 ). Thecomparator 220 provides the test outputs to a graphical processing unit(GPU) of the computing device 606 for display of one or more of progressbars PB1, PB2, and PBz on a portion 612A of a display screen 614 of thecomputing device 606, where z is an integer greater than zero.

In one embodiment, eight progress bars are displayed on the displayscreen 614 of the computing device 606. Four of the eight progress barsshow progress of execution of four threads on one CPU, e.g., theprocessor 101, etc., of the computing device 606 and the remaining fourprogress bars show progress of execution of four threads on another CPUof the computing device 606. When a first thread includes a driverscenario model that is next in sequence to a driver scenario model of asecond thread, the first thread is a consumer thread and the secondthread is a producer thread. Moreover, another portion 612B of thedisplay screen 614 displays a portion of a computer program code of oneof the test files 502 (FIG. 5 ) or a portion of a compiled filegenerated from the test file.

In an embodiment, a thread is a subset, e.g., a smallest sequence, etc.,of computer instructions that is managed independently by a scheduler.One or more threads are part of a process and share resources, e.g.,time share resources, time division multiplex resources, etc., anddifferent processes do not share the resources. Examples of resourcesinclude memory devices, addresses within one or more memory devices,etc. In one embodiment, threads of a process share instructions, e.g.,operands, operands and data, etc., of the process.

In one embodiment, when a test is executed on an SoC or the prototype ofthe SoC or the emulator of the SoC, the SoC or the emulator or theprototype is not able to communicate with the comparator 220. Anapplication programming interface (API), e.g., a C API, a C++ API, etc.,is applied by the computing device 606 between the SoC or the emulatoror the prototype and the comparator 220 to enable the SoC or theemulator or the prototype and the comparator to communicate with eachother.

In an embodiment, a checking protocol, e.g., checksum, cyclic redundancycheck (CRC), etc., is performed by Test File Generation Module-Si 452 onexpected output data to be generated by the SoC 602 to generate a firstresult which is stored in Events file 504. The checking protocol isapplied on the actual output data by a processor of the SoC 602 togenerate a second result. The first and second results are compared witheach other by the computing device 606 to determine whether there is amatch between the first and second results. Upon determining that thefirst and second results match, the computing device 606 determines thatthe SoC 602 passed a test and on the other hand, upon determining thatthe first and second results do not match each other, the computingdevice 606 determines that the SoC 602 did not pass the test. In oneembodiment, the second result is stored within a memory device of theSoC 602 for providing to the computing device via the UART 605. In anembodiment, the second result is provided to the computing device 606via the UART 605 without storing the second result within the memorydevice of the SoC 602 to save memory device space on the SOC 602.

In one embodiment, data is received in an order by the computing device606 from multiple channels that are coupled to a component of an SoC.The order of data is checked by a processor of the computing device 606against a pre-stored order to determine whether the data is receivedaccording to the pre-stored order.

FIG. 7 is a diagram of an embodiment of a graph 700 to illustrate ascenario model, e.g., one of the scenario models 206 (FIG. 2A-2 ), etc.,one or more expected outputs of the scenario model, and one or moreinputs of the scenario model. Applying the scenario model facilitates atest by the processor 101 or by another processor whether a vehicle isoverheating.

The processor 101 or another processor determines that expected outputsof the test include that the vehicle keeps moving forward or that thevehicle stops. The one or more inputs of the scenario model areconstrained from execution by the processor 101 based on the expectedoutputs of the scenario model. For example, the one or more inputs arelimited to an ignition of the vehicle being on, the vehicle being in adrive gear, and gas paddle being applied to achieve the expected outputthat the vehicle keeps moving forward. To test the vehicle, the vehicleis driven in the drive gear, the ignition is on, and the gas paddle isapplied. In this example, the one or more inputs do not include theignition being off, the vehicle being in park, the vehicle being in areverse gear, and applying a brake to the vehicle. As another example,the one or more inputs are limited to an ignition of the vehicle beingon and a brake paddle being applied to achieve the expected output thatthe vehicle stops. To test the vehicle, the ignition is on and the brakepaddle is applied. In this example, the one or more inputs do notinclude the applying the gas paddle to the vehicle.

The one or more inputs generated after applying constraints are thenused as one or more stimulus' by the processor 101 or by anotherprocessor to test the vehicle for overheating. The one or more stimulus'are used to generate one or more test outputs, which are compared to theexpected outputs. For example, when a test output is that the vehiclemoves forward for a period of time of performance of the test, thevehicle passes the test. As another example, when a test output is thatthe vehicle has stopped during performance of the test, the vehiclefails the test.

FIG. 8-1 is a diagram of an embodiment of a graph 800 for illustrating aconstraint of a driver scenario model 802 affecting another driverscenario model 804. The driver scenario model 802 is that of an imageprocessor module representation or of an image processor. For example,the driver scenario model 802 is generated based on functions performedby an image processor of an SoC. Moreover, the driver scenario model 804is that of an SD card controller module representation or of an SD cardcontroller. For example, the driver scenario model 804 is generatedbased on functions performed by an SD card controller of an SOC.

Each driver scenario model 802 and 804 includes sub-modules. Forexample, the driver scenario model 802 includes a configurationsub-module that is executed by the processor 101 to configure the driverscenario model 802. The configuration of the driver scenario model 802is done to achieve a quality of encoding or decoding image data.Moreover, the configuration of the driver scenario model 802 is done toenable or disable functionality of the driver scenario model 802. Asanother example, the driver scenario model 804 includes a configurationsub-module that is executed by the processor 101 to configure the driverscenario model 804. The configuration of the driver scenario model 804is done to achieve a quality of image data that is stored in an SD cardby the driver scenario model 804. Moreover, the configuration of thedriver scenario model 804 is done to enable or disable functionality ofthe driver scenario model 804.

As yet another example, the driver scenario model 802 includes acompletion sub-module. The completion sub-module is executed todetermine whether a function executed by the driver scenario model 802is completed. The completion is indicated by the driver scenario model802 either by waiting for an interrupt or by changing a status of astatus bit. In one embodiment, the completion is sequentially followedby or preceded by checking of a memory device module representation thatis connected to the driver scenario model 802 or an I/O modulerepresentation that is connected to the driver scenario model 802.

As another example, the driver scenario model 804 includes a completionsub-module. The completion sub-module is executed to determine whether afunction executed by the driver scenario model 804 is completed. Thecompletion is indicated by the driver scenario model 804 either bywaiting for an interrupt or by changing a status bit. In one embodiment,the completion is sequentially followed by or preceded by checking of amemory device module representation that is connected to the driverscenario model 804 or an I/O module representation that is connected tothe driver scenario model 804.

As another example, the driver scenario model 802 includes a checksub-module. The check sub-module is executed to determine whether amemory device module representation of the driver scenario model 802 isto be checked, or a register module representation of the driverscenario model 802 is to be checked, or an I/O module representation ofthe driver scenario model 802 is to be checked. As another example, thedriver scenario model 804 includes a check sub-module. The checksub-module is executed to determine whether a memory device modulerepresentation of the driver scenario model 804 is to be checked, or aregister module representation of the driver scenario model 804 is to bechecked, or an I/O module representation of the driver scenario model804 is to be checked.

As yet another example, each of the driver scenario models 802 and 804includes a get-source module that is executed by the processor 101. Theget-source module of the driver scenario model 802 is executed to invokefunctionality of the driver scenario model 804.

It should be noted that a quality of image data stored by the driverscenario model 804 in an SD card provides a constraint to a quality ofencoding or decoding performed by the driver scenario model 802.

In one embodiment, a driver scenario model is accessed, instead of beinggenerated, from a library of driver scenario models, e.g., C codesequences, etc., by the processor 101. In an embodiment, a driverscenario model is accessed from the library and then customized by theprocessor 101 or by the user to generate a semi-customized driverscenario model. In one embodiment, a driver scenario model is generatedby the processor 101 or by the user to generate a customized driverscenario model.

In an embodiment, an application scenario model is formed by acombination of the driver scenario models 802 and 804. Constraints areapplied across the driver scenario models 802 and 804 to generate theapplication scenario model. The constraints are applied to achieve anexpected outcome to further generate a stimulus.

It should be noted that each of quality sub-module representation, modesub-module representation, and completion sub-module representation isan example of a decision point. Each decision at a decision point ismade by the processor 101 to lead to one or more paths in a data flow,e.g., a scenario model, etc. An outcome of a decision is a vertex, e.g.,an output, etc. For example, each of high, low, a, b, interrupt, andpoll is an example of a vertex.

Moreover, a selection of a vertex either by the processor 101 or by theuser via an input device results in a constraint in that another vertexcannot be reached during execution of a scenario model. For example,when a selection is received that the driver scenario model 802 is tocomplete its execution based on an interrupt, the driver scenario model802 cannot complete execution via polling. As another example, when aselection is received that the driver scenario model 804 is to storeimage data having high quality, the driver scenario model 804 cannotstore image data having a low quality. Such graphical based constraintsresult in rapid solving of complex scenario models compared to algebraicconstraints.

FIG. 8-2 is a diagram of an embodiment of a system 830 for illustratinga manner in which a driver scenario model 834 provides a constraint toanother driver scenario model 832. The driver scenario model 834 appliesthe constraint on the driver scenario model 832 to facilitate generationof an output by the driver scenario model 832. The output is generatedfrom an input applied to the driver scenario model 832. Also, the outputis applied as a constrained input by the driver scenario model 832 tothe driver scenario model 834. The driver scenario model 834 generatesan output, e.g., a test output, etc., when the constrained input isapplied.

FIG. 8-3 is a diagram of an embodiment of a system 840 to illustrate useof one or more constraints to control processing performed by a videoprocessor module representation. Examples of processing performed by thevideo processor module representation include encoding, decoding,scaling, playing a video, etc.

Parameters of a display device 1 provide a constraint to the videoprocessor module representation. Examples of the parameters of a displaydevice include a display resolution of the display device, a size of thedisplay device, a processing speed of a GPU of the display device, asize of a memory device of the display device, etc. For example, anaspect ratio of the display device 1 controls a size of an image that isdisplayed on the display device 1. The size of the image is achieved byprocessing performed by the video processor module representation. Asanother example, a display resolution of the display device 1 controlsan image resolution of an image that is displayed on the display device1.

Moreover, parameters of the video processor module representationconstrain a USB controller module representation. Examples of parametersof the video processor module representation include a video resolution,an image size, a rate with which video data is encoded or decoded, arate at which a size of a video is changed, etc. Examples of parametersof the USB controller module representation include a speed of transferof image data, a speed of transfer of video data, serial transfer ofdata, parallel transfer of data, etc.

The parameters of the video processor module representation control theparameters of the USB controller module representation. For example,when a rate of encoding or decoding video data is greater than apre-determined limit, a rate of transferring the video data from the USBcontroller module representation to the video processor modulerepresentation is greater than a pre-determined value. As anotherexample, when a rate of encoding or decoding video data is less than thepre-determined limit, a rate of transferring the video data from the USBcontroller module representation to the video processor modulerepresentation is less than the pre-determined value.

The system 840 also illustrates various application scenario models. Oneof the application scenario models includes receiving video data fromthe SD card controller module representation and processing the videodata. The processing of the video data is performed by the videoprocessor module representation. Furthermore, the processed video datais sent by the video processor module representation to the displaydevice 1, which renders the video data to display a video.

Another one of the application scenario models includes receiving imagedata from the SD card controller module representation and encoding ordecoding the image data. The encoding or decoding is performed by theimage processor module representation. Furthermore, the decoded orencoded image data is sent by the image processor module representationto a display device 2, which renders the image data to display an image.

Yet another one of the application scenario models includes receivingvideo data from the USB controller module representation and processingthe video data. For example, the video data is received via a USB portmodule representation from a computer or a mobile device, e.g., a cellphone, a smart phone, a tablet, etc. The processing of the video data isperformed by the video processor module representation. Furthermore, theprocessed video data is sent by the video processor modulerepresentation to the display device 1, which renders the video data todisplay a video.

Another one of the application scenario models includes receiving imagedata from the USB controller module representation and encoding ordecoding the image data. The encoding or decoding is performed by theimage processor module representation. Furthermore, the decoded orencoded image data is sent by the image processor module representationto the display device 2, which renders the image data to display animage.

FIG. 8-4 is a diagram of an embodiment of a graph 850 for illustratinguse of an application scenario model that further uses memory devicemodule representations for storing data to be used by IP blocks.Examples of the IP blocks include any of the module representations Athrough G (FIG. 3 ). In the application scenario model, the imageprocessor module representation retrieves one or more constraints from amemory device module representation MEM2. Moreover, a configurationsub-module representation of the image processor module representationis executed by the processor 101 or by another processor to constrainthe image processor module representation based on the one or moreconstraints accessed from the memory device module representation MEM2.For example, the configuration sub-module representation of the imageprocessor module representation is executed to confine a quality ofdecoding or encoding based on the constraint retrieved from the memorydevice module representation. As another example, the configurationsub-module representation of the image processor module representationis executed to determine that a quality of encoding or decoding will belower than a pre-set value.

The constraint regarding the quality of encoding or decoding istransferred from the image processor module representation to the memorydevice module representation MEM1. The constraint regarding the qualityof encoding or decoding is retrieved from the memory device modulerepresentation MEM1 by a configuration sub-module representation of thecamera module representation. Based on the retrieved determination, theconfiguration sub-module representation of the camera modulerepresentation is executed by the processor 101 or by another processorto determine that a quality of processing done by the camera modulerepresentation will be lower than a predetermined quality. Examples ofthe processing done by the camera module representation are described asfunctions performed by the camera module representation above. Thequality of processing is applied to an image captured by the CCD. Theconstraint regarding the quality of encoding or decoding retrieved fromthe memory device module representation MEM1 by the configurationsub-module representation of the camera module representation constrainsthe quality of processing performed by the camera module representation.

In one embodiment, the configuration sub-module representation of theimage processor module representation is executed to determine that aquality of encoding or decoding will be greater than the pre-set value.The determination is transferred from the image processor modulerepresentation to the memory device module representation MEM1. Thedetermination is retrieved by the configuration sub-modulerepresentation of the camera module representation. Based on theretrieved determination, the configuration sub-module representation ofthe camera module representation is executed by the processor 101 or byanother processor to determine that a quality of processing done by thecamera module representation will be greater than a pre-determinedquality.

FIG. 8-5 is a diagram of an embodiment of the graph 850 to illustrate aperformance scenario model. The performance scenario model constraintsthe application scenario model of FIG. 8-4 to create representativebenchmark tests. For example, the performance scenario model includes aconstraint that completion of execution of the image processor modulerepresentation is indicated by waiting for an interrupt from aprocessor. A completion sub-module of a module representation isexecuted during completion of a function performed by the modulerepresentation. As another example, the performance scenario modelincludes a constraint that the configuration sub-module of the imageprocessor module representation be configured to encode or decode with aquality that is greater than the pre-set value.

As another example, the performance scenario model includes a constraintthat the configuration sub-module of the image processor modulerepresentation be configured to encode or decode in mode a. Examples ofa mode of encoding or decoding image data include a deferred mode inwhich image data is encoded or decoded after a pre-determined timeperiod, a current mode in which image data is encoded or decoded as soonas the image data is stored in a memory device module representation,etc.

The constraints regarding completion of execution of the image processormodule representation, the mode of operation of the image processormodule representation, and a quality of encoding or decoding by theimage processor module representation are stored within the memorydevice module representation MEM1. The constraints stored within thememory device module representation MEM1 are used to constrainconfiguration and/or completion of an operation of the camera modulerepresentation. For example, the constraint regarding the interruptionof the image processor module representation triggers a constraintwithin the camera module representation. The constraint triggeredincludes that when a completion sub-module of the camera modulerepresentation is executed by the processor 101 or by another processor,the camera module representation is interrupted by another driverscenario model. As another example the constraint regarding the qualityof encoding or decoding by the image processor module representationtriggers a constraint within the camera module representation. Theconstraint triggered includes that the configuration sub-module of thecamera module representation be configured to process image data with aquality that is greater than a pre-determined quality.

As yet another example, the constraint regarding the mode of encoding ordecoding by the image processor module representation triggers aconstraint within the camera module representation. The constrainttriggered includes that the configuration sub-module of the cameramodule representation be configured to process image data in a mode a.Examples of a mode of processing image data using the camera modulerepresentation include a deferred mode in which image data is processedby the camera module representation after a pre-determined time period,or a current mode in which image data is processed by the camera modulerepresentation as soon as the image data is stored in a memory devicemodule representation, etc.

The constraints of the camera module representation are used to defineconstraints of the CCD module representation.

Other examples of a constraint of a module representation includechecking a memory of the module representation, checking a register ofthe module representation, checking an I/O of the module representation,enabling the module representation to perform an operation, disablingthe module representation from performing an operation, etc.

FIG. 9-1 is a diagram of an embodiment of a graph 900 to illustrate adivision of an application scenario across multiple CPUs, e.g., a CPU1,a CPU2, and a CPU3, etc., during a test. In an embodiment, each CPU1,CPU2, and CPU3 is a CPU module representation, e.g. a VIP, etc., of atest bench. In one embodiment, each CPU1, CPU2, and CPU3 is acomputer-generated model, e.g., a design, etc., of a CPU within a testbench. In one embodiment, the graph 900 is displayed on the portion 612A(FIG. 6 ) of the computing device 606. Three CPUs of a computing deviceare used to execute multiple application scenario models and/or a numberof driver scenario models. The three CPUs interact with each other toapply one or more application scenario models and/or a number of driverscenario models.

In one application scenario model, a driver scenario model in which thecamera module representation processes image data is executed by theCPU2. Then, as indicated by a dashed arrow, in the application scenariomodel, the processed image data is encoded by a driver scenario modelthat includes the image processor module representation. The driverscenario model that encodes the processed image data is executed by theCPU1. Thereafter, as indicated by another dashed arrow, in theapplication scenario, the encoded image data is sent to a driverscenario model that includes the SD card controller modulerepresentation for writing to an SD card. The SD card controller modulerepresentation is executed by the CPU 3.

Moreover, in another application scenario model, a driver scenario modelin which the SD card controller module representation reads image datafrom an SD card is executed by the CPU1. Then, as indicated by a solidarrow, in the application scenario model, the read image data is decodedby a driver scenario model that includes the image processor modulerepresentation. The driver scenario model that decodes the image data isexecuted by the CPU3. Thereafter, as indicated by another solid arrow,in the application scenario, the decoded image data is sent to a driverscenario model that includes the display controller modulerepresentation. The display controller module representation is executedby the CPU2.

Furthermore, in yet another application scenario, a driver scenariomodel in which the SD card controller module representation reads imagedata from an SD card is executed by the CPU2. Then, as indicated by adotted arrow, in the application scenario, the read image data isreceived by a driver scenario model that includes the display controllermodule representation for display on a display device.

It should be noted that each empty region between driver scenario modelsthat are displayed in the graph 900 is a cell. A cell indicates a timeduring which a driver scenario model is not being executed by theprocessor 101 or by another processor.

It should also be noted that a timeline progresses along the graph 900vertically from top to bottom. For example, a driver scenario model inwhich the SD card controller module representation reads image data froman SD card is executed simultaneously with, e.g., at the same time,etc., a driver scenario model in which the camera module representationprocesses image data. As another example, image data is processed by thecamera module representation during a time period in which image data isread by the SD card controller module representation. As yet anotherexample, a driver scenario model in which an SD card controller modulerepresentation reads image data from an SD card is executedsimultaneously with, e.g., at the same time, at substantially the sametime, etc., another driver scenario model in which an SD card controllermodule representation reads image data from the same or another SD card.To further illustrate, an SD card controller module representation readsdata from a memory region, e.g., a memory bank, a set of memoryaddresses, a set of consecutive memory addresses, etc., of an SD cardsimultaneous with reading by another SD card controller modulerepresentation of data from a memory region of the same or another SDcard.

In one embodiment, simultaneous, as used herein, means during a time orat the same or substantially at the same time. For example, twooperations are performed simultaneously when one operation is performedduring performed of the other operation. As another example, twooperations are performed simultaneously when one of the operations isperformed within a pre-determined time interval of initiatingperformance of another one of the operations and before the other one ofthe operations has finished execution.

It should further be noted that in one embodiment, when a first CPUexecutes a driver scenario model that is next in sequence to a driverscenario model executed by a second CPU, the first CPU is a consumer CPUand the second CPU is a producer CPU.

In one embodiment, instead of one or more CPUs executing one or morescenario models, execution of the scenario models is divided amongmultiple threads that are executed by one or more CPUs, e.g., CPUs of acomputing device, CPUs of an SoC, etc. As an example, a driver scenariomodel of an application scenario model is scheduled by the processor 101to be executed within one thread and another driver scenario model ofthe application scenario model is scheduled by the processor 101 to beexecuted within another thread. For example, execution of driverscenario models encompassed within two application scenario models issplit into execution of multiple threads by the processor 101. Tofurther illustrate, one of the driver scenario models is executed withina first thread and another one of the driver scenario models is executedwithin a second thread. As another example, the driver scenario modelsthat are executed by the CPU1 in FIG. 9-1 are executed within a firstcomputer thread, the driver scenario models that are executed by theCPU2 in FIG. 9-1 are executed within a second computer thread, and thedriver scenario models that are executed by the CPU3 in FIG. 9-1 areexecuted within a third computer thread.

The division to be performed of a scenario model into multiple threadsis designated within a test file or within multiple test files by theprocessor 101. For example, the processor 101 designates that a testfile that includes multiple scenario models be divided into multipletest files and each of the multiple test files includes one or moredriver scenario models of one or more of the scenario models. A sequenceof execution of driver scenario models within a scenario model becomes aflow, e.g., a schedule, etc., when the scenario model is split betweenmultiple threads or between multiple CPUs for execution during a test.

In one embodiment, the processor 101 designates, e.g., identifies, etc.,in one or more test files a CPU or a thread that is to execute a driverscenario model of an application scenario model. For example, theprocessor 101 designates within a test file that a driver scenario modelin which the camera module representation processes image data is to beexecuted by the CPU2 or within a computer thread 2 and a driver scenariomodel for encoding processed image data is to be executed by the CPU1 orwithin a computer thread 1.

In an embodiment, a CPU executes any number of driver scenario models,or any number of application scenario models, or any number ofperformance scenario models.

In one embodiment, a memory device is allocated to a CPU and access tothe memory device is blocked to other CPUs.

In an embodiment, a memory device is allocated to a scenario model andaccess to the memory device is blocked to other scenario models.

In one embodiment, the CPU1 is a master CPU that executes a driverscenario model first and the execution triggers one or more driverscenario models in one or more of the other CPUs2 and 3. In anembodiment, execution of all of the CPU1, the CPU2, and CPU3 iscontrolled by a master CPU. In this embodiment, the master CPU does notexecute a driver scenario model and co-ordinates an order of executionof a number of driver scenario models by the CPU1, CPU2, and CPU3.

In an embodiment, the CPU1 communicates with an IP block to perform atask, e.g., a transaction, a read transaction, a write transaction, anencoding operation, a decoding operation, a capturing image operation, adisplaying image operation, etc. The CPU1 waits for the IP block tofinish the transaction, either by polling for a done bit or by waitingfor an interrupt from the IP block. The CPU1 also waits for a result ofthe task from the IP block and then checks the result against anexpected outcome, which is stored in a memory device. The IP block isexecuted by another CPU.

In one embodiment, a processing capability of the CPU1 is used by alarge number of IP blocks. Each IP block executes a thread on the CPU1and a task performed by one IP block is distinguished from a taskperformed by another IP block. In this embodiment, one thread is mutexprotected from another thread. For example, a spinlock is used by eachthread to determine whether a producer operation has finished execution.The thread determines whether the spinlock is available beforeinitiating its own execution. The thread waits for the other thread tofinish execution before its own execution. In an embodiment, instead ofthe mutex protection, a memory device is allocated to a thread for apre-set time or until the thread finishes execution.

In an embodiment, processing capability of the CPU1 is used by a largenumber of IP blocks. Each IP block acts a state machine, each of whichemulates the behavior of a thread.

In an embodiment, a number of the CPUs1, 2, and 3 is the same as anumber of CPUs in an SoC. In one embodiment, a number of threadsexecuted by one or more of the CPUs1, 2, and 3 is the same as a numberof threads executed within an SoC.

In one embodiment, execution of a driver scenario model by a firstthread generates a constraint. As a result of the constraint, anotherdriver scenario model cannot be executed by a second thread. In thisembodiment, both the threads are executed using the same CPU. In anembodiment, both the threads are executed using different CPUs.

FIG. 9-2 is a diagram of an embodiment of a graph 920 to illustrate useof memory regions in one or more memory devices to store data for accessby one or more driver scenario models during a test. In one embodiment,the graph 920 is displayed on the portion 612A (FIG. 6 ) of thecomputing device 606. In one embodiment, a memory region is a range ofmemory addresses of a memory device, e.g., a memory device used duringexecution of a test bench program, etc. For example, a memory region 1is a first range of addresses in a memory device and a memory region 2is a second range of addresses in the memory device. The first rangedoes not overlap the second range. In an embodiment, the memory region 1is a range of addresses in a memory device and the memory region 2 is arange of addresses in another memory device.

The processor 101 splits memory addresses of one or more memory devicesinto multiple memory regions for use during a test of an SoC or a modelof the SoC.

In one embodiments, a manner in which memory addresses of one or morememory devices are to be split is designated in a test file. Forexample, a test file is generated by the processor 101 to include thatmemory addresses be split into the memory region 1, the memory region 2,and the memory region 3 during a test in which a scenario model isexecuted.

In one application scenario model illustrated by solid arrows, a driverscenario model that includes the SD card controller modulerepresentation is executed by the processor 101 to read data from an SDcard VIP and to further write the read data as a joint photographicexperts group-encoded image 1 (JPEG-encoded image 1) to a portion of thememory region 1. The data is written via a direct memory access (DMA).

In another application scenario model illustrated by dashed arrows,another driver scenario model that includes the image processor modulerepresentation is executed by the processor 101 to retrieve theJPEG-encoded image data 1 from the portion of the memory region 1, todecode the JPEG-encoded image data 1 to generate decoded image data, andto provide the decoded image data as a raw image data 2 for storage inthe memory region 2. Moreover, in the application scenario, a driverscenario model that executes the image processor module representationobtains the raw image data 2 from the portion of the memory region 2,and encodes the raw image to generate encoded image data, and providesthe encoded image data as a JPEG-encoded image data 2 to a memory region3.

In one embodiment, the memory region 3 is a range of addresses withinthe same memory device that includes the memory regions 1 and/or 2. Inan embodiment, the memory region three is a range of addresses within adifferent memory device from a memory device that includes the memoryregion 1. In one embodiment, the memory region three is a range ofaddresses within a different memory device from a memory device thatincludes the memory region 2.

In yet another application scenario illustrated by minutely-dashedarrows, a driver scenario model that includes the display controllermodule representation retrieves the raw image data 2 from the portion ofthe memory region 2 and provides the raw image data 2 to a display VIPfor display of an image.

In another application scenario illustrated by dotted arrows, a driverscenario model that includes the camera module representation obtainsimage data from a CCD VIP, processes the image data, and provides theprocessed image data to the memory region 2 for storage as the raw imagedata 2.

In still another application scenario illustrated by the cross arrows, adriver scenario model that includes the SD card controller modulerepresentation reads the JPEG-encoded image data 2 from the memoryregion 3, and writes the JPEG-encoded image data 2 to an SD card VIP.

It should be noted that in one embodiment, a number of the memoryregions displayed in the graph 920 is the same as a number of memoryregions in an SoC. In an embodiment, a number of the memory regionsdisplayed in the graph 920 is different than a number of memory regionsthat an SoC.

In an embodiment, a memory device module representation is allocated toa thread and access of the memory device module representation isblocked to other threads until the thread finishes use of the memorydevice module representation.

FIG. 10 is a diagram of an embodiment of a system 1000 for illustratingexecution of multiple scenario models in parallel by the processor 101or by multiple CPUs or by multiple threads. In a first scenario model,the SD card controller module representation reads data from an SD card.In the first scenario model, the image processor module representationobtains the read data from the SD card controller module representationand decodes the read data to generate decoded data. In the firstscenario model, a display controller module representation 1 obtains thedecoded data from the image processor module representation and rendersthe decoded data to generate an image on the display device 1.

In a second scenario model, a display controller module representation 2obtains the decoded data from the image processor module representationand renders the decoded data to generate an image on a display device 2.

In a third scenario model, a USB controller module representationretrieves the decoded data from the image processor modulerepresentation and transfers the decoded data to a USB port for furthertransfer to a device, e.g., a computing device, a mobile device, anintegrated circuit, etc.

In a fourth scenario model, the SD card controller module representationretrieves the decoded data from the image processor modulerepresentation and transfers the decoded data to an SD card for storage.

In a fifth scenario model, the image processor module representationobtains data that is received by the USB controller modulerepresentation from the USB port. In the fifth scenario model, the imageprocessor module representation decodes the obtained data to generatedecoded data. In the fifth scenario model, the display controller modulerepresentation 1 obtains the decoded data from the image processormodule representation and renders the decoded data to generate an imageon the display device 1.

A sixth scenario model is similar to the second scenario model exceptthat the sixth scenario model is performed using the decoded data thatis generated from the data received from the USB port.

Moreover, a seventh scenario model is similar to the third scenariomodel except that the seventh scenario model is performed using thedecoded data that is generated from the data received from the USB port.

An eighth scenario model is similar to the fourth scenario model exceptthat the eighth scenario model is performed using the decoded data thatis generated from the data received from the USB port.

In a ninth scenario model, the camera module representation processesimage data that is captured using a CCD. The image processor modulerepresentation retrieves the processed image data from the camera modulerepresentation and decodes the image data to generate decoded imagedata. The decoded image data is sent to the display controller modulerepresentation 1 in a manner described above in the first scenariomodel.

A tenth scenario model is similar to the second scenario model exceptthat the tenth scenario model is performed using the decoded data thatis generated from the data received from the camera modulerepresentation.

Moreover, an eleventh scenario model is similar to the third scenariomodel except that the eleventh scenario model is performed using thedecoded data that is generated from the data received from the cameramodule representation.

A twelfth scenario model is similar to the fourth scenario model exceptthat the twelfth scenario model is performed using the decoded data thatis generated from the data received from the camera modulerepresentation.

In a thirteenth scenario model, the SD card controller modulerepresentation reads data from an SD card or an SD card modulerepresentation. In the thirteenth scenario model, the video processormodule representation obtains the read data from the SD card controllermodule representation and processes the read data to generate processeddata. In the thirteenth scenario model, the display controller modulerepresentation 1 obtains the processed data from the video processormodule representation and renders the processed data to generate a videoon the display device 1.

In a fourteenth scenario model, the display controller modulerepresentation 2 obtains the processed data from the video processormodule representation and renders the processed data to generate a videoon the display device 2.

In a fifteenth scenario model, the USB controller module representationretrieves the processed data from the video processor modulerepresentation and transfers the processed data to a USB port forfurther transfer to a device, e.g., a computing device, a mobile device,an integrated circuit, etc.

In a sixteenth scenario model, the SD card controller modulerepresentation retrieves the processed data from the video processormodule representation and transfers the processed data to an SD card forstorage.

In a seventeenth scenario model, the video processor modulerepresentation obtains data that is received by the USB controllermodule representation from the USB port. In the seventeenth scenariomodel, the video processor module representation processes the obtaineddata to generate processed data. In the seventeenth scenario model, thedisplay controller module representation 1 obtains the processed datafrom the video processor module representation and renders the processeddata to generate a video on the display device 1.

An eighteenth scenario model is similar to the fourteenth scenario modelexcept that the eighteenth scenario model is performed using theprocessed data that is generated from the data received from the USBport.

Moreover, a nineteenth scenario model is similar to the fifteenthscenario model except that the nineteenth scenario model is performedusing the processed data that is generated from the data received fromthe USB port.

A twentieth scenario model is similar to the sixteenth scenario modelexcept that the twentieth scenario model is performed using theprocessed data that is generated from the data received from the USBport.

In a twenty-first scenario model, the camera module representationprocesses video data that is captured using the CCD. The video processormodule representation retrieves the video data that is processed by thecamera module representation and further processes the video data togenerate further processed video data. The further processed video datais sent to the display controller module representation 1 in a mannerdescribed above in the thirteenth scenario model.

A twenty-second scenario model is similar to the fourteenth scenariomodel except that the twenty-second scenario model is performed usingthe further processed data that is generated from the data received fromthe camera module representation.

Moreover, a twenty-third scenario model is similar to the fifteenthscenario model except that the twenty-third scenario model is performedusing the further processed data that is generated from the datareceived from the camera module representation.

A twenty-fourth scenario model is similar to the sixteenth scenariomodel except that the twenty-fourth scenario model is performed usingthe further processed data that is generated from the data received fromthe camera module representation.

FIG. 11 is a diagram of an embodiment of a display screen 1100 toillustrate use of multiple threads and/or multiple CPUs to execute anumber of scenario models. In one embodiment, the display screen 1100 isan example of a display screen of a computing device, e.g., thecomputing device 606 (FIG. 6 ).

The display screen 1100 displays a graphical portion 1102 and a textualportion 1104. Both the graphical portion 1102 and the textual portion1104 are displayed by the GPU of the computing device 606 upon executionof a test. In one embodiment, the portions 1102 and 1104 are generatedafter the comparator 220 (FIG. 3 ) is executed. In the portion 1102,four threads, e.g., T1, T2, T3, and T4, etc., are executed by the CPU1.Moreover, in the portion 1102, four additional threads, e.g., T1, T2,T3, and T4, etc., are executed by the CPU2. Each thread executes one ormore driver scenario models. An application scenario model includesswitching between driver scenario models. For example, in an applicationscenario model, a driver scenario model is executed within the threadT3, which is executed by the CPU1. In the application scenario model,upon execution of the driver scenario model within the thread T3, asindicated by an arrow, execution switches to another driver scenariomodel, which is a portion of the thread T2, which is executed by theCPU2. Moreover, in the application scenario model, upon execution of thedriver scenario model within the thread T2 by the CPU2, executionswitches to executing yet another driver scenario model within thethread T4, which is executed by the CPU1.

A flow of execution is illustrated using an arrow in FIG. 11 . Forexample, an arrow indicates a flow in which a driver scenario model isexecuted by the CPU2 within the thread T2 after a driver scenario modelis executed within the thread T3 by the CPU1. As another example, anarrow indicates a flow in which a driver scenario model is executed bythe CPU1 within the thread T4 after a driver scenario model is executedwithin the thread T2 by the CPU2.

It should be noted that the darkened driver scenario models, e.g., adarkened scenario model 1106, etc., in the display portion 1102 havecompleted execution. Moreover, the dotted driver scenario models, e.g.,a dotted scenario model 1108, etc., in the display portion 1102 areawaiting execution. Also, the empty scenario models with a darkenedborder, e.g., an empty scenario model 1110, etc., in the display portion1102 have paused execution as a result of a breakpoint. In oneembodiment, a breakpoint is an intentional stopping or pausing of acomputer program code in a compiled file for debugging. In theembodiment, the user inspects a test environment, e.g., register modulerepresentations, memory device module representations, IP blocks, etc.,that is executed until the breakpoint to find out whether computerprogram code is functioning as expected.

Moreover, the portion 1104 includes a portion of a computer programcode, e.g., a code of a test file, a code of a compiled file, etc., thatincludes a code of one or more of the driver scenario models that areshown in the portion 1102. For example, when there is an error duringexecution of one the scenario models 206 on a test bench, a computerprogram code for the one of the scenario models 206, e.g., stored in oneof the test files 208 (FIG. 2A-2 ), etc., is displayed in the portion1104. As another example, when one the scenario models 206 does notexecute on a test bench, a computer program code for the one of thescenario models 206 is displayed as being highlighted in the portion1104. As yet another example, upon receiving a selection of the emptyscenario model 1110, the processor 101 commands the GPU to display aportion of a code of a compiled file or of a source code file, e.g., atest file, etc., for execution of the empty scenario model 1110. Theselection is received from the user via the input device. The portion ofthe code is displayed in the portion 1104. To illustrate, the portion ofthe code is displayed as being highlighted or as zoomed-in compared toremaining code that is displayed in the portion 1104. In an embodiment,the zoom-in portion overlaps with a portion of the display portion 1102.

In one embodiment, the portion 1104 includes a computer code, e.g., asource code, a compiled code, etc., for executing the driver scenariomodels that are displayed in the display portion 1102. For example, as adisplay of the driver scenario models changes in the display portion1102 with execution of the driver scenario models, a computer code forthe driver scenario models also changes in the display portion 1102. Thechanged computer code is that of the changed driver scenario models thatare displayed in the display portion 1102.

In an embodiment, when a selection of a driver scenario model isreceived via the input device from the user, a computer code for thedriver scenario model is highlighted by the GPU in the portion 1104compared to computer codes of other driver scenario models in theportion 1104.

In an embodiment, highlighted, as used herein, includes darkened, ortextured, or shaded, or displayed in a different color, or zoomed-in, orzoomed-out, or a combination thereof.

It should be noted that in one embodiment, a number of threads executedby a CPU displayed in the portion 1102 is the same as a number ofthreads executed by CPU of an SoC. The use of the same number of threadsas that of the SoC allows for execution of a realistic test of the SoC.In an embodiment, a number of threads executed by a CPU is displayed inthe portion 1102 is the different from a number of threads executed byCPU of an SoC.

Each thread is represented as a vertical bar graph. For example, thethread T1 that is executed by the CPU1 is represented as a vertical bargraph, the thread T2 that is executed by the CPU 2 is represented as avertical bar graph, etc. In an embodiment, instead of a vertical bargraph, a thread is displayed by the GPU of the computing device 606 as ahorizontal bar graph or as a diagonal bar graph.

In an embodiment, a different display format that than illustrated isused to distinguish a driver scenario model that is awaiting executionfrom a driver scenario model that has completed execution and/or from adriver scenario model that has reached a breakpoint. For example, theGPU of the computing device 606 displays a driver scenario model thathas finished execution in a different texture, or a different shade, ora different color, or a combination thereof than a driver scenario modelthat is to be executed. As another example, the GPU of the computingdevice 606 displays a driver scenario model that has reached abreakpoint using a different texture, or a different shade, or adifferent color, or a combination thereof than a driver scenario modelthat is to be executed.

In one embodiment, a number of CPUs displayed in the portion 1102 is thesame as a number of CPUs of an SoC. The use of the same number of CPUsas that of the SoC allows for execution of a realistic test of the SoC.In an embodiment, a number of CPUs displayed in the portion 1102 isdifferent from a number of CPUs of an SoC.

In an embodiment, a thread is executed to execute any number of driverscenario models, or any number of application scenario models, or anynumber of performance scenario models. In one embodiment, a thread isexecuted to execute a portion of a driver scenario model. For example, afirst input provided to an arbiter scenario model, which is furtherdescribed below, is processed in a thread and a second input provided tothe arbiter scenario model is processed in another thread. This allowsfacilitating a resolution of non-determinism of arbitration. Forexample, when the thread associated with the first input winsarbitration, the thread notifies the other thread associated with thesecond input of the same.

In one embodiment, a first computer thread is executed by a first CPUand a second computer thread is executed by a second CPU. When the firstand second computer threads use one memory device, the memory device ismutex-protected. For example, the first computer thread locks a mutex,e.g., a unique name, a unique value, etc., while the first computerthread is executing and using data from a memory device. Until the firstcomputer thread uses the memory device and the mutex protection isenabled, the second computer thread cannot use, e.g., access data from,write data to, etc., the memory device. In an embodiment, the mutexprotection is tested using a test bench and a scenario model, describedherein. In one embodiment, the mutex protection applies when the firstcomputer thread is executed by the first CPU and the second computerthread is executed by the first CPU.

In an embodiment, any element of a portion that is displayed on thedisplay screen 1100 by the GPU is displayed by performing a renderingoperation on data that is stored in a memory device, e.g., a memorydevice of the computing device 606, etc. For example, the dottedscenario model 1108 is displayed by rendering data that is stored in amemory device of the computing device 606.

FIG. 12 is a diagram of an embodiment of a computer program code toenable integration of the SOC scenario models 206 into a test bench,e.g., the test bench 214 (FIG. 4-1 ), the test bench 412 (FIG. 4-1 ),the test bench 406 (FIG. 4-1 ), etc. It should be noted that thecomputer program code is used for illustrative purposes only and that inone embodiment, other languages or other computer program codes are usedfor achieving the simple integration.

FIG. 13 is a diagram of an embodiment of a screen shot 1300 forillustrating visualization of one or more paths leading to a selection,by the processor 101, of one or more inputs 1302A, 1302B, 1302C, e.g.,one or more stimulus', etc., based on a scenario model 1304 and based onoutputs 1306A and 1306B of the scenario model 1304. The scenario model1304 is an example of one of the SOC scenario models 206 (FIG. 2A-2 ).The one or more paths are highlighted in the screen shot 1300 as a path1308A and a path 1308B. For example, the path 1308A is highlighted indots and the path 1308B is highlighted in a dark solid line.

The path 1308A is generated by the processor 101 between the scenariomodel 1304 and the output 1306A and the input 1302A. Also, the path1308A is between the scenario model 1304, the output 1306A, and theinput 1302C. It is indicated by the path 1308A that the output 1306A isbased on the scenario model 1304, and the input 1302A and 1302C arebased on the output 1306A. The path 1308B is generated by the processor101 between the scenario model 1304 and the expected output 1306B andthe input 1302B. It is indicated by the path 1308B that the expectedoutput 1306B is based on the scenario model 1304, and the input 1302B isbased on the expected output 1306B. The user can view the paths 1308Aand 1308B on a display screen of a computing device.

It should be noted that the output 1306A is constrained by the processor101 from being achieved when the expected output 1306B is to beachieved.

In one embodiment, the path 1308B is highlighted by the processor 101upon execution of a scenario model illustrated by the path 1308B tofacilitate the user to see the path 1308B. The visualization helps theuser to determine whether an application scenario model illustrated bythe path 1308B has completed execution.

In an embodiment, any number of paths that have finished execution ishighlighted by the processor 101. The user is able to see that multiplehighlighted paths that coincide with each other to indicate to the userthat cross coverage of scenario models is done. Each path indicatesperformance of a scenario model.

The path 1308A is an example of an unexecutable test case based on aconstraint that the output 1306A cannot be achieved when the expectedoutput 1306B is achieved. In one embodiment, instead of or in additionto highlighting the path 1308A, a path that includes one or more driverscenario models is highlighted by the processor 101. For example, a paththat links the empty scenario model 1110 (FIG. 11 ) to other driverscenario models is bolded or colored by the processor 101. In thisexample, some of the other driver scenario models are connected to aninput node of the empty scenario model 1110 and the remaining of theother driver scenario models are connected to an output node of theempty scenario model 1110. To further illustrate, the some of the otherdriver scenario models are linked as a chain to the input node of theempty scenario model 1110 and the remaining of the other driver scenariomodels are linked as a chain to the output node of the empty scenariomodel 1110. In an embodiment, the other driver scenario models and theempty scenario model 1110 are linked to form an application scenariomodel or a performance scenario model.

In an embodiment, the path 1308B is included in the screen shot 1300 andthe path 1308A is excluded from the screen shot 1300 to a display aperformance constraint to the user.

In some embodiments, a test constraint, e.g., a performance constraint,etc., is displayed as logic, e.g., a computer program code, etc.,instead of in a graphical format illustrated in the screen shot 1330.

In one embodiment, the path that links the empty scenario model 1110 tothe other driver scenario models includes sub-module representations ofthe empty scenario model 1110 and the other driver scenario models.

FIG. 14A is a diagram of an embodiment of a system 1400 to illustrategeneration of a verification space, e.g., a module representation, asub-module representation, etc., from a component of an SoC or adescription of the component of the SoC. In one embodiment, averification space is generated by the processor 101 or by anotherprocessor. The verification space is further used to generate one ormore stimulus' from expected outputs.

In one embodiment, the description of the component of the SoC is withinthe file that defines the SoC. For example, the processor 101 receivesthe file defining the SoC and the file includes a description of afunction of a component of the SoC.

A queue is an example of a component of an SoC and has one input portand one output port. The queue generates an outcome, e.g., a primaryoutcome, a secondary outcome, a test output, etc., when a pre-requisite,e.g., an input, a stimulus, etc., is applied to the queue. In oneembodiment, the queue supports backpressure from a component that isconnected to the output port of the queue. For example, when a data rateof the component connected to the output port of the queue is less thana data rate of data that is output from the queue, the component sends amessage to the queue that the component cannot process data receivedfrom the queue. In an embodiment, when the queue includes a memorydevice for internal storage of data, data output from the queue isout-of-order compared to an order in which data is received at the inputport of the queue.

In one embodiment, a primary outcome of the queue is data that is outputfrom the queue when data is input to the queue. A secondary outcome ofthe queue is an overflow or underflow of data within a memory deviceused for internal storage within the queue. The overflow or underflowoccurs with respect to a rate of reception of data by the queue or arate of transfer of data from the queue. Another secondary outcome ofthe queue is sending of data by the queue in a different order than inwhich the data is received by the queue.

A verification space Vqueue corresponding to the queue is generated bythe processor 101 from the queue. The verification space of the queueperforms the same functions as that of the queue. In one embodiment, theverification space Vqueue is defined by the processor 101 as a scenariomodel for the queue. An outcome, e.g., the primary outcome, thesecondary outcome, etc., of the queue is determined to be an expectedoutput by the processor 101 or by another processor. In one embodiment,the expected output of the queue is received within the file thatdefines the SoC.

The expected output of the queue is applied by the processor 101 to theverification space Vqueue to determine the pre-requisite of the queue.The pre-requisite of the queue is then used as a stimulus duringapplication of a scenario model in which the verification space Vqueueis applied. In one embodiment, the pre-requisite of the queue is used togenerate a test output of the queue, which is compared to the expectedoutput of the queue to determine whether the queue passed a test. In anembodiment, the pre-requisite of the queue is used to generate a testoutput of a scenario model, which is compared to an expected output ofthe scenario model to determine whether the scenario model passed atest.

Similarly, an arbiter is a component of the SoC that receives two ormore pre-requisites for generating one outcome. The arbiter has a singleoutput port fed by a number of input ports. In an embodiment, the inputports support back-pressure capability to inform requestors, e.g.,components of an SoC that generate a request, etc., that an output portof the arbiter is unavailable for transferring data. The arbiterarbitrates between the two or more pre-requisites that are received atabout the same time, e.g., concurrently, within a pre-determined timerange, etc., to determine which of the two or more pre-requisites is tobe allowed to be an output of the arbiter first or is allowed to be anoutput of the arbiter. For example, the arbiter arbitrates based on atype of a requestor, e.g., low priority, high priority, etc., a type ofdata, e.g., low priority data, high priority data, etc., a time at whichdata is received from a requestor, or a combination thereof.

A verification space Varbiter corresponding to the arbiter is generatedby the processor 101 and the verification space Varbiter is executed bythe processor 101 to perform the same functions as that of the arbiter.In one embodiment, the verification space Varbiter is defined by theprocessor 101 as a scenario model for the arbiter. The verificationspace Varbiter is used by the processor 101 to generate the two or morepre-requisites from an expected output of the Varbiter to furthergenerate a test output. In one embodiment, the test output of theVarbiter is compared by the comparator 220 (FIG. 2A-2 ) with theexpected output of the Varbiter to determine whether the Varbiter passeda test.

In one embodiment, a primary outcome of the arbiter is data that thearbiter is capable of providing at its output port. The data is providedbased on a random selection of data from one of input ports of thearbiter or times of arrival of data at its input ports. In anembodiment, a secondary outcome of the arbiter includes a combination oftimings associated with a transfer of data via the arbiter and ofpriorities associated with the transfer of data. In one embodiment, asecondary outcome of the arbiter is to create backpressure in asituation in which the arbiter becomes saturated, e.g., overflows, etc.,from data received at its input ports.

Moreover, a distributor distributes data, e.g., a video stream, apre-requisite, an audio stream, a multimedia stream, etc., that isreceived as input by the distributor to a number of channels in the formof the number of outputs. The distributor has multiple output ports thatare fed by a single input port. In one embodiment, one of the inputoutput ports is selected by the distributor based on a destination thatis specified within data received at the input port of the distributor.

The distributor is a component of the SoC that receives onepre-requisite for generating a number of outputs. The distributordistributes the pre-requisite based on one or more conditions, e.g.,whether a component attached to the distributor is ready to accept anoutput, an address of a destination component within a portion of thepre-requisite, etc. For example, the distributor does not distribute aportion of the pre-requisite to a component of the SoC until thedistributor receives a backpressure from the component. A verificationspace Vdistributor that performs the same functions as that of thedistributor is generated by the processor 101. In one embodiment, theverification space Vdistributor is defined by the processor 101 as ascenario model for the distributor. The verification space Vdistributoris used by the processor 101 to generate the pre-requisite from a numberof expected outputs of the distributor to further generate the samenumber of test outputs. In one embodiment, the test outputs of theVdistributor are compared by the processor 101 with correspondingexpected outputs of the Vdistributor to determine whether theVdistributor passes a test.

In one embodiment, a primary outcome of the distributor is data at itsoutput ports and a secondary outcome of the distributor is a rate atwhich the data is distributed at each of its output ports.

In an embodiment, a verification space of a component of an SoC iscoupled to another verification space for storing data, e.g., averification space Vreg of a register, a verification space Vmem or amemory device, etc. The verification space for storing data is generatedby the processor 101 based on functions performed by a memory device,e.g., a RAM, a ROM, a memory device within a component of an SoC, aregister, a flash memory, a hard disk, a compact disc, a digital videodisc, a disk array, a virtual memory region within a memory device, etc.For example, when a memory device is coupled to a component of the SoC,the verification space for storing data is connected by the processor101 to the verification space having a functionality of the component.In one embodiment, the verification space Vmem is defined by theprocessor 101 as a scenario model for a memory device. Moreover, in anembodiment, the verification space Vreg is defined by the processor 101as a scenario model for a register. Also, in an embodiment, theverification space having a functionality of a component of an SoC isdefined by the processor 101 as a scenario model for the component. Forexample, the verification space having a functionality of a component ofan SoC is defined by the processor 101 as a scenario model that includesan application of the functionality of the component.

In one embodiment, a memory device module representation is used, e.g.,accessed for reading or writing, etc., at a time by one scenario model.For example, when a memory device module representation is accessed byan application scenario model at a time, the memory device modulerepresentation cannot be accessed by another application scenario modelor a driver scenario model or a performance scenario model at the sametime. To avoid conflict between multiple scenario models that access thesame memory device module representation, the processor 101 determines atime of access of the memory device module representation by eachscenario model or informs a scenario model when the memory device modulerepresentation will be available for access by the scenario model.

The verification space for storing data is connected to provide an inputto or receive an output from a verification space of a component of anSoC based on whether a memory device is connected at an input node or anoutput node of the component. For example, if a memory device of the SoCis connected at an input node of a component of the SoC, theverification space for storing data is connected to provide an input toa verification space of the component. As another example, if a memorydevice of an SoC is connected at an output node of a component of theSoC, the verification space for storing data is connected to receive anoutput from a verification space of the component.

In one embodiment, a discrete memory element, e.g., one or more memoryaddresses in a memory device, one or more registers, etc., is allocatedby a discrete allocator to a first component of an SoC until a referencecount reaches zero or a pre-determined value. The processor 101 keeps alog of the reference count. A second component of the SoC cannot accessthe discrete memory element for storage or data or for obtaining datauntil the discrete memory element is allocated to the first componentand until the reference count reaches zero or a pre-determined value.The reference count is a number of times the discrete memory element isaccessed by the first component.

A primary outcome of the discrete allocator is to allocate the discretememory element to a component that requests the discrete memory element,or to decrement the reference count to reach zero, or to increment thereference count to reach a pre-determined value, or to free the discretememory element from being allocated to the component, or a combinationthereof. The primary outcome of the discrete allocator is used by theprocessor 101 to determine pre-requisites of the discrete allocator. Thepre-requisites of the discrete allocator include a definition of a poolof available resources for allocation by the discrete allocator,configuration of the discrete allocator to define whether the discretememory element can be allocated more than once to one component, orconfiguration the discrete memory element, or a combination thereof.Examples of a secondary outcome of the discrete allocator include are-use a recently freed discrete memory element and a permutation of,e.g., re-arrangement of allocation of, etc., a pool of discrete memoryelements to maximize use of the discrete memory elements. In oneembodiment, a resource and a memory device are used interchangeablyherein. Another example of a resource includes a bus fabric.

A verification space Vdiscrete is generated by the processor 101 basedon functions performed by the discrete allocator. In one embodiment, theverification space Vdiscrete is defined by the processor 101 as ascenario model for the discrete allocator. In an embodiment, a discretememory element of a memory device module representation is allocated bya discrete allocator module representation to a first scenario modeluntil a reference count reaches zero. A second scenario model cannotaccess the discrete memory element of the memory device modulerepresentation until the discrete memory element is allocated to thefirst scenario model and until the reference count reaches zero orreaches a pre-determined value. The reference count is a number of timesthe discrete memory element is accessed by the first scenario model.

A verification space Vcontinuous is a verification space generated bythe processor 101 for a continuous allocator that allocates a continuousblock, e.g., region of sequential memory addresses, etc., of elementswithin a memory device. In one embodiment, the verification spaceVcontinuous is defined by the processor 101 as a scenario model for thecontinuous allocator. The continuous block is allocated to or freed froma requestor of the continuous block. The requestor specifies to theallocator whether the continuous block is to be allocated to therequestor, or is already allocated to the requestor and is to be used bythe requestor for multiple operations during the same data flow, e.g., ascenario model, etc. In case of multiple operations, the requestor orthe continuous allocator increments or decrements a number of themultiple operations.

In one embodiment, the continuous allocator defines data in an allocatedcontinuous block. For example, the continuous allocator staticallyinitializes, e.g., resets, sets, etc., a block of memory elements in acontinuous block or arranges for the memory elements to be initializedby another agent, e.g., in case of a direct memory access to a memorydevice, etc.

Examples of primary outcomes of the continuous allocator includeallocation of a contiguous block of memory elements of a pre-determinedlength, incrementing or decrementing a reference count indicating anumber of the multiple operations performed for a previously allocatedblock of memory elements, freeing a previously allocated block of memoryelements from being allocated to a requestor, etc. Examples ofpre-requisites of the continuous allocator include a definition ofavailable contiguous blocks in one or more memory devices, staticinitialization of data in a contiguous block, dynamic initialization ofdata in a contiguous block by another agent, etc. Examples of secondaryoutcome of the continuous allocator include an arrangement of multiplecontiguous blocks to test for nonexistence of overlap between themultiple contiguous blocks in case of read and write operations, anarrangement of partial re-use of a portion of a contiguous block when anagent, e.g. requestor, etc., fails to write back in time to a remainingportion of the contiguous block, an arrangement for false sharing inwhich different agents use adjacent memory locations of a contiguousblock to test cache coherency, an arrangement for true sharing in whichdifferent agents use the same memory locations to test cache coherency,tracking of a memory shadow state that is a state of a shadow of amemory device of an SoC, etc.

The verification space Vreg is generated by the processor 101 based on aregister or a number of registers, e.g., registers having a width of 32bits or 64 bits or 128 bits or 256 bits, etc. In one embodiment, aregister is a configuration register that is used to set up modes inwhich an SoC operates or includes a portion of an instruction to operatethe SoC. In an embodiment, a number of registers is organized by aninstance of a component of an SoC. Each component instance has a baseaddress and offsets for each register.

An example of primary outcomes of a number of registers includesregister values stored in the registers. Other examples of primaryoutcomes of registers include register values that are obtained by theregisters or by a component of an SoC from a number of shadow registersfor storage in the registers. Examples of pre-requisites of a number ofregisters include register address offsets, base addresses for eachinstance of a component of an SoC, ability to execute a readinstruction, ability to execute a write instruction, etc. Examples ofsecondary outcomes of a number of registers include register values thatare provided by the registers based on randomized timings to test forregister pipeline issues and register values that are provided by theregisters based on a random ordering of register operations to test forhardware dependencies on the register ordering.

A verification space Vstruct is generated by the processor 101 based ona data structure or a number of data structures, e.g., memory devices,other than registers, that store data, etc. In one embodiment, theverification space Vstruct is defined by the processor 101 as a scenariomodel for a data structure. A format, e.g., extensible markup language(XML) format, tree, graphical, array, etc., is used to define fields indata structures.

An example of primary outcomes of a number of data structures includes avalues stored in the data structures. Other examples of primary outcomesof data structures include values that are obtained by the datastructures or by a component of an SoC from a number of shadow registersfor storage in the data structures. Examples of pre-requisites of datastructures include data structure address offsets, base addresses of thedata structures, ability to execute a read instruction, ability toexecute a write instruction, etc.

In an embodiment, a module representation, other than a memory devicemodule representation, has a primary outcome of transferring data fromone memory device module representation to another memory device modulerepresentation, or from a memory device module representation to aninput/output module representation, or from an input/output modulerepresentation to a memory device module representation. The modulerepresentation, other than a memory device module representation, has asecondary output to indicate backpressure to one or more input ports ofthe module representation, and/or to indicate signal interrupts, and/orto perform direct memory access (DMA) to or from a memory device modulerepresentation. For example, a video decoder module representation has aprimary outcome of storing decoded image data in a memory device modulerepresentation, and a video display module representation has a primaryoutcome of producing a composite image for display on a display device.

In an embodiment, a memory device module representation has a primaryoutcome of facilitating a read or a write and a secondary outcome offacilitating the read or write at a data rate, e.g., a double data rate,a data rate higher or lower than a double data rate, etc. In oneembodiment, a cache module representation has a primary outcome offacilitating a read or a write and a secondary outcome of fetching dataor snooping data from a main memory device module representation.

FIG. 14B is a diagram of an embodiment of a system to illustrategeneration of a stimulus from an expected output O1 of a pipelinescenario model 1420. A verification space VC receives an output O1 as anexpected output and generates an intermediate value IV2 from the outputO1. The verification space VC is generated by the processor 101 byapplying the module representation C. For example, the verificationspace VC performs the same functions as that of the modulerepresentation C.

A verification space VB receives the intermediate value IV2 from theverification space VC and generates an intermediate value IV1 from theintermediate value IV2. The verification space VB is generated by theprocessor 101 from the module representation B. For example, theverification space VB performs the same functions as that of the modulerepresentation B.

A verification space VA receives the intermediate value IV1 from theverification space VB and generates an input I1, which is an example ofa stimulus, from the intermediate value IV1. The verification space VAis generated by the processor 101 from the module representation A. Forexample, the verification space VA performs the same functions as thatof the module representation A.

The module representation A receives the stimulus I1 and generates theintermediate value IV1 from the stimulus I1. The module representation Breceives the intermediate value IV1 from the module representation A andgenerates the intermediate value IV2 from the intermediate value IV1.The module representation C receives the intermediate value IV2 from themodule representation B and generates the output O1, which is a testoutput. The test output O1 is compared to the expected output O1 todetermine whether the test output O1 matches the expected output O1 oris within a pre-determined threshold of the expected output O1. Upondetermining that the test output O1 is within the pre-determinedthreshold of the expected output O1 or matches the expected output O1,the processor 101 determines that the pipeline scenario model 1420passes a test. On the other hand, upon determining that the test outputO1 is not within the pre-determined threshold of the expected output O1or does not match the expected output O1, the processor 101 determinesthat the pipeline scenario model 1420 fails a test.

In one embodiment, instead of the module representations A, B, and C, acomponent of an SoC is used to describe FIG. 14B. For example, acomponent of an SoC from which the module representation A is generatedis used instead of the module representation A to generate theintermediate value IV1.

In an embodiment, an intermediate value, as described herein, is anexample of an expected outcome and the intermediate value is checked,e.g., tested, compared, etc., against a test outcome.

FIG. 14C is a diagram of an embodiment of a system to illustrategeneration of stimuli I1, I2, I3, and I4 from expected outputs O1 and O2of a switch scenario model 1430. The output O1 and an output O2 arereceived as expected outputs by a verification space VD. Theverification space VD generates an intermediate value IV3 from theoutputs O1 and O2. The verification space VD is generated by theprocessor 101 from the module representation D. For example, theverification space VD performs the same functions as that of the modulerepresentation D.

The verification space VC receives the intermediate value IV3 from theverification space VD and generates the intermediate values IV1 and IV2from the intermediate value IV3. The verification space VA receives theintermediate value IV1 from the verification space VC and generates theinput I1 and an input I2, which are examples of stimuli, from theintermediate value IV1. Moreover, the verification space VB receives theintermediate value IV2 from the verification space VC and generatesinputs I3 and I4, which are examples of stimuli, from the intermediatevalue IV2.

Moreover, as shown, the module representation A receives the input I1and the input I2 and generates the intermediate value IV1 from theinputs I1 and I2. Also, the module representation B receives the inputsI3 and I4 and generates the intermediate value IV2 from the inputs I3and I4.

In one embodiment, the intermediate value IV1 is the same or within arange of the input I1. In an embodiment, the intermediate value IV1 isthe same or within a range of the input I2. For example, when the modulerepresentation A is a representation of an arbiter component, e.g., aswitch, etc., of an SoC, the arbiter component switches betweenproviding the inputs I1 and I2 as the intermediate value IV1. Toillustrate, the arbiter component outputs the input I1 as theintermediate value IV1 when there is no push back from a queuesub-module of the module representation C or a queue sub-module of themodule representation D or a queue sub-module of another modulerepresentation connected to the module representation D. In thisillustration, the arbiter component does not output the input I1 as theintermediate value IV1 when there is a push back from another queuesub-module of the module representation C or another queue of the modulerepresentation D.

Moreover, the module representation C receives the intermediate valuesIV1 and IV2 from the respective module representations A and B, andgenerates the intermediate value IV3 from the intermediate values IV1and IV2. For example, when the module representation C is generatedbased on functions performed by an arbiter, the module representation Coutputs the intermediate values IV1 or IV2 as the intermediate value IV3based on the conditions. As another example, when the modulerepresentation C is a summer or a multiplier or a divider, the modulerepresentation C sums or multiplies or divides the intermediate valueIV1 and IV2 to generate the intermediate value IV3.

Furthermore, the module representation D receives the intermediate valueIV3 from the module representation C and generates the output O1 and anoutput O2 from the intermediate value IV3. For example, when the modulerepresentation D represents a distributor, e.g., a de-multiplexer, aswitch, etc., the intermediate value IV3 is distributed to the outputsO1 and O2, which are test outputs.

The test output O1 is compared to the expected output O1 to determinewhether the test output O1 matches the expected output O1 or is within apre-determined threshold of the expected output O1. Similarly, the testoutput O2 is compared to the expected output O2 to determine whether thetest output O2 matches the expected output O2 or is within apre-determined threshold of the expected output O2. Upon determiningthat the test output O1 is within the pre-determined threshold of theexpected output O1 or matches the expected output O1 and upondetermining that the test output O2 is within the pre-determinedthreshold of the expected output O2 or matches the expected output O2,the processor 101 determines that the switch scenario model 1430 passesa test. On the other hand, upon determining that the test output O1 isnot within the pre-determined threshold of the expected output O1 ordoes not match the expected output O1 and/or upon determining that thetest output O2 is not within the pre-determined threshold of theexpected output O2 or does not match the expected output O2, theprocessor 101 determines that the switch scenario model 1430 fails atest.

In one embodiment, instead of the module representations A, B, C, and D,a component of an SoC is used to describe FIG. 14C. For example, acomponent of an SoC from which the module representation C is generatedis used instead of the module representation C to generate theintermediate value IV3.

In an embodiment, a switch scenario module representation has a primaryoutcome of routing a transaction to one of its output ports. The switchscenario module representation has a secondary outcome that assertsbackpressure on its input ports and/or has a secondary outcome thatcreates buffer overflow of a buffer module representation that iscoupled to the switch scenario module representation and/or has asecondary outcome that creates buffer underflow of the buffer modulerepresentation. The backpressure on the input ports indicates errorconditions regarding transfer of data via the switch scenario model.

FIG. 14D is a diagram of an embodiment of a system to illustrategeneration of a stimulus from the expected output O1 of a pipelinescenario model 1440. The output O1 is applied as an expected output to averification space VAout. The verification space VAout receives theoutput O1 and generates an intermediate value IV4 from the output O1.The verification space VAout is generated by the processor 101 from themodule representation A. For example, the verification space VAoutperforms one or more functions performed by the module representation A.

A verification space VBout receives the intermediate value IV4 as aninput from the verification space VAout and generates the intermediatevalue IV3 from the intermediate value IV4. The verification space VBoutis generated by the processor 101 from the module representation B. Forexample, the verification space VBout performs one or more functionsperformed by the module representation B.

A verification space VCout receives the intermediate value IV3 from theverification space VB out and generates an intermediate value from theintermediate value IV3. The verification space VCout is generated by theprocessor 101 from the module representation C. For example, theverification space VCout performs one or more functions performed by themodule representation C.

A verification space VCin receives the intermediate value generated bythe verification space VCout and generates the intermediate value IV2from the intermediate value generated by the verification space VCout.The verification space VCin is generated by the processor 101 from themodule representation C. For example, the verification space VCinperforms one or more functions performed by the module representation C.

It should be noted that in one embodiment, the verification space VCinperforms a different function than that performed by the verificationspace VCout. In an embodiment, the verification space VCin performs thesame function as that performed by the verification space VCout.

A verification space VBin receives the intermediate value IV2 from theverification space VCin and generates the intermediate value IV1 fromthe intermediate value IV2. The verification space VBin is generated bythe processor 101 from the module representation B. For example, theverification space VBin performs one or more functions performed by themodule representation B.

It should be noted that in one embodiment, the verification space VBinperforms a different function than that performed by the verificationspace VBout. In an embodiment, the verification space VBin performs thesame function as that performed by the verification space VBout.

A verification space VAin receives the intermediate value IV1 from theverification space VBin and generates the input I1, which is an exampleof a stimulus, from the intermediate value IV1. The verification spaceVAin is generated by the processor 101 from the module representation A.For example, the verification space VAin performs one or more functionsperformed by the module representation A.

It should be noted that in one embodiment, the verification space VAinperforms a different function than that performed by the verificationspace VAout. In an embodiment, the verification space VAin performs thesame function as that performed by the verification space VAout.

The stimulus I1 is forward propagated via the pipeline scenario model140 that involves the module representations A, B, and C to generate theoutput O1. For example, the module representation A receives the inputI1 and generates the intermediate value IV1 from the input I1. Moreover,the module representation B receives the intermediate value IV1 from themodule representation A and generates the intermediate value IV2 fromthe intermediate value IV1. Furthermore, the module representation Creceives the intermediate value IV2 from the module representation B andgenerates the intermediate value IV3 from the intermediate value IV2.Also, the module representation B receives the intermediate value IV3from the module representation C and generates the intermediate valueIV4 from the intermediate value IV3. The module representation Areceives the intermediate value IV4 from the module representation B andgenerates the output O1 as a test output from the intermediate valueIV4.

The test output O1 is compared to the expected output O1 to determinewhether the test output O1 matches the expected output O1 or is within apre-determined threshold of the expected output O1. Upon determiningthat the test output O1 is within the pre-determined threshold of theexpected output O1 or matches the expected output O1, the processor 101determines that the pipeline scenario model 1440 passes a test. On theother hand, upon determining that the test output O1 is not within thepre-determined threshold of the expected output O1 or does not match theexpected output O1, the processor 101 determines that the pipelinescenario model 1430 fails a test.

In one embodiment, instead of the module representations A, B, and C, acomponent of an SoC is used to describe FIG. 14D. For example, acomponent of an SoC from which the module representation B is generatedis used instead of the module representation B to generate theintermediate values IV2 and IV4.

FIG. 14E-1 is a diagram of an embodiment of a scenario model 1450 toillustrate generation of verification spaces for performing a writeoperation. During the write operation, the processor 101 uses the outputO1 as an expected output. The expected output O1 is received by averification space VMEMX and sent by the verification space VMEMX to theverification space VC. The verification space VMEMX is generated by theprocessor 101 and has the same functions as that of a memory devicemodule representation MemX. The verification space VC determines whetherthe expected output O1 is received from a first requestor or a secondrequestor, both of which are described below. Upon determining that theexpected output O1 is received from the first requestor, theverification space VC generates the intermediate value IV1 from theoutput O1 and provides the intermediate value IV1 to the verificationspace VA. The verification space VA generates the input value I1 fromthe intermediate value IV1 and sends the input value I1 to the firstrequestor. Moreover, upon determining that the expected output O1 isreceived from the first requestor, the verification space VC generatesdata D1 and provides the data D1 to verification space VB, which furthersends the data D1 to the first requestor.

Upon determining that the expected output O1 is received from the secondrequestor, the verification space VC generates the intermediate valueIV1 from the output O1 and provides the intermediate value IV1 to theverification space VA. The verification space VA generates the inputvalue I2 from the intermediate value IV1 and sends the input value I2 tothe second requestor. Moreover, upon determining that the expectedoutput O1 is received from the second requestor, the verification spaceVC generates data D2 and provides the data D2 to verification space VB,which further sends the data D2 to the second requestor.

Moreover, during the write operation, the processor 101 uses the outputO2 as an expected output. The expected output O2 is received by averification space VMEMY and is sent by the verification space VMEMY tothe verification space VD. The verification space VMEMY is generated bythe processor 101 and has the same functions as that of a memory devicemodule representation MemY. The verification space VD determines whetherthe expected output O2 is received from the first requestor or thesecond requestor. Upon determining that the expected output O2 isreceived from the first requestor, the verification space VD generatesthe intermediate value IV2 from the output O2 and provides theintermediate value IV2 to the verification space VA. The verificationspace VA generates the input value I1 from the intermediate value IV2and sends the input value I1 to the first requestor. Moreover, upondetermining that the expected output O2 is received from the firstrequestor, the verification space VD generates the data D1 and providesthe data D1 to the verification space VB, which further sends the dataD1 to the first requestor.

Upon determining that the expected output O2 is received from the secondrequestor, the verification space VD generates the intermediate valueIV2 from the output O2 and provides the intermediate value IV2 to theverification space VA. The verification space VA generates the inputvalue I2 from the intermediate value IV2 and sends the input value I2 tothe second requestor. Moreover, upon determining that the expectedoutput O2 is received from the second requestor, the verification spaceVD generates the data D2 and provides the data D2 to verification spaceVB, which further sends the data D2 to the second requestor.

During the write operation, the inputs I1, I2 and the data D1 and D2 areforward propagated via the corresponding module representations A, B, C,D, MemX, and MemY to generate test outputs, e.g., the outputs O1 and O2.During the write operation, the input I1 is received from the firstrequestor, e.g., an IP block, etc., which provides an instruction toperform the write operation and indicates an address, e.g., an addresswithin a memory device module representation MemX, an address within amemory device module representation MemY, etc., at which data is to bewritten.

When the write operation is to be performed to the memory device modulerepresentation MemX, the instruction for performing the write operationand the address of the write operation are provided as the intermediatevalue IV1 to the module representation C. The module representation Crequests data to be written to the address from the modulerepresentation B and the module representation B further requests dataD1 from the first requestor. The data D1 is provided via the modulerepresentations B and C to be written to the memory device modulerepresentation MemX. The data D1 is provided to the memory device modulerepresentation MemX as the output O1.

If the write operation is to be performed by the first requestor to thememory device module representation MemY, the instruction of performingthe write operation and the address of the write operation are providedas the intermediate value IV2 to the module representation D. The memorydevice module representation D requests data to be written to theaddress from the module representation B and the module representation Bfurther requests the data D1 from the first requestor. The data D1 isprovided via the module representations B and D to be written to thememory device module representation MemY. The data D1 is provided to thememory device module representation MemY as the output O2.

During the write operation, the input I2 is received from the secondrequestor, e.g., an IP block, etc., which provides an instructionwhether to perform a read operation or a write operation and indicatesan address, e.g., an address within a memory device modulerepresentation MemX, an address within a memory device modulerepresentation MemY, etc., at which data is to be written.

If the write operation is to be performed to the memory device modulerepresentation MemX by the second requestor, the instruction ofperforming the write operation and the address of the write operationare provided as the intermediate value IV1 to the module representationC. The module representation C requests data to be written to theaddress from the module representation B and the module representation Bfurther requests data D2 from the second requestor. The data D2 isprovided via the module representations B and C to be written to thememory device module representation MemX. The data D2 is provided to thememory device module representation MemX as the output O1.

If the write operation is to be performed by the second requestor to thememory device module representation MemY, the instruction of performingthe write operation and the address of the write operation are providedas the intermediate value IV2 to the module representation D by themodule representation A. The memory device module representation Drequests data to be written to the address from the modulerepresentation B and the module representation B further requests thedata D2 from the second requestor. The data D2 is provided via themodule representations B and D to be written to the memory device modulerepresentation MemY. The data D2 is provided to the memory device modulerepresentation MemY as the output O2.

During the write operation, a test output is compared by the processor101 with a corresponding expected output to determine whether thescenario model 1450 passed a test. For example, it is determined by theprocessor 101 whether the test output O1 is the same as or is within apre-determined threshold of the expected output O1. Upon determiningthat the test output O1 is the same as or is within a pre-determinedthreshold of the expected output O1, the processor 101 determines thatthe scenario model 1450 passes a test for the write operation. On theother hand, upon determining that the test output O1 is not the same asor is not within the pre-determined threshold of the expected output O1,the processor 101 determines that the scenario model 1450 fails a testfor the write operation. As another example, it is determined by theprocessor 101 whether the test output O2 is the same as or is within apre-determined threshold of the expected output O2. Upon determiningthat the test output O2 is the same as or is within a pre-determinedthreshold of the expected output O2, the processor 101 determines thatthe scenario model 1450 passes a test for the write operation. On theother hand, upon determining that the test output O2 is not the same asor is not within the pre-determined threshold of the expected output O2,the processor 101 determines that the scenario model 1450 fails a testfor the write operation.

In one embodiment, instead of the module representations A, B, C, D,MemX, and MemY, components of an SoC are used to describe FIG. 14E-1 .

FIG. 14E-2 is a diagram of an embodiment of a scenario model 1460 toillustrate generation of verification spaces for performing a readoperation. During the read operation, the processor 101 uses the outputO1 as an expected output. It is determined by the verification space VCthat the expected output O1 received by the verification space VC is tobe provided to the verification space VMemX. The verification space VCfurther determines whether the expected output O1 is to be received fromthe first requestor or the second requestor. Upon determining that theexpected output O1 is to be received from the first requestor for theread operation, the verification space VC generates the intermediatevalue IV1 from the output O1 and provides the intermediate value IV1 tothe verification space VA. The verification space VA generates the inputvalue I1 from the intermediate value IV1 and sends the input value I1 tothe first requestor. Moreover, upon determining that the expected outputO1 is to be received from the first requestor for the read operation,the verification space VC sends a request for the data D1 and providesthe request for the data D1 to the verification space VB, which furthersends the request to the first requestor to receive the data D1 from thefirst requestor.

Upon determining that the expected output O1 is to be received from thesecond requestor for the read operation, the verification space VCgenerates the intermediate value IV1 from the output O1 and provides theintermediate value IV1 to the verification space VA. The verificationspace VA generates the input value I2 from the intermediate value IV1and sends the input value I2 to the second requestor. Moreover, upondetermining that the expected output O1 is to be received from thesecond requestor for the read operation, the verification space VC sendsa request for the data D2 and provides the request for the data D2 tothe verification space VB, which further sends the request to the secondrequestor to receive the data D2 from the second requestor.

The processor 101 uses the output O2 as an expected output. It isdetermined by the verification space VD that the expected output O2 isto be provided to the verification space VMemY by the verification spaceVD. The verification space VD further determines whether the expectedoutput O2 is to be received from the first requestor or the secondrequestor. Upon determining that the expected output O2 is to bereceived from the first requestor for the read operation, theverification space VD generates the intermediate value IV2 from theoutput O2 and provides the intermediate value IV2 to the verificationspace VA. The verification space VA generates the input value I1 fromthe intermediate value IV2 and sends the input value I1 to the firstrequestor. Moreover, upon determining that the expected output O2 is tobe received from the first requestor for the read operation, theverification space VD sends a request for the data D1 and provides therequest for the data D1 to the verification space VB, which furthersends the request to the first requestor to receive the data D1 from thefirst requestor.

Upon determining that the expected output O2 is to be received from thesecond requestor for the read operation, the verification space VDgenerates the intermediate value IV2 from the output O2 and provides theintermediate value IV2 to the verification space VA. The verificationspace VA generates the input value I2 from the intermediate value IV2and sends the input value I2 to the second requestor. Moreover, upondetermining that the expected output O2 is to be received from thesecond requestor for the read operation, the verification space VD sendsa request for the data D2 and provides the request for the data D2 tothe verification space VB, which further sends the request to the secondrequestor to receive the data D2 from the second requestor.

During the read operation, the inputs I1, I2 are forward propagated andthe data D1 and D2 are backward propagated via the corresponding modulerepresentations A, B, C, D, MemX, and MemY to generate test outputs,e.g., the outputs O1 and O2. During the read operation, the input I1 isreceived from the first requestor indicating to perform the readoperation and indicating an address, e.g., an address within a memorydevice module representation MemX, an address within a memory devicemodule representation MemY, etc., from which data is to be read.

When the read operation is to be performed from the memory device modulerepresentation MemX by the first requestor, the instruction ofperforming the read operation and the address of the read operation areprovided as the intermediate value IV1 to the module representation C.The module representation C requests data to be read from the address ofthe memory device module representation MemX. Upon receiving the requestfor reading the data, the memory device module representation MemXprovides the output O1 as data to the module representation C. Moreover,the memory device module representation C determines that the firstrequestor requested the read operation and provides the read data to themodule representation B for sending to the first requestor. The modulerepresentation B provides the data D1 as an output to the firstrequestor upon receiving the read data from the module representation Cand upon receiving an indication that the read data is to be sent to thefirst requestor.

When the read operation is to be performed from the memory device modulerepresentation MemY by the first requestor, the instruction ofperforming the read operation and the address of the read operation areprovided as the intermediate value IV2 to the module representation D.The module representation D requests data to be read from the address ofthe memory device module representation MemY. Upon receiving the requestfor reading the data, the memory device module representation MemYprovides the output O2 as data to the module representation D. Moreover,the module representation D determines that the first requestorrequested the read operation and provides the read data to the modulerepresentation B for sending to the first requestor. The modulerepresentation B provides the data D1 as an output to the firstrequestor upon receiving the read data from the module representation Dand upon receiving an indication that the read data is to be sent to thefirst requestor.

When the read operation is to be performed from the memory device modulerepresentation MemX by the second requestor, the instruction ofperforming the read operation and the address of the read operation areprovided as the intermediate value IV1 to the module representation C.The module representation C requests data to be read from the address ofthe memory device module representation MemX. Upon receiving the requestfor reading the data, the memory device module representation MemXprovides the output O1 as data to the module representation C. Moreover,the memory device module representation C determines that the secondrequestor requested the read operation and provides the read data to themodule representation B for sending to the second requestor. The modulerepresentation B provides the data D1 as an output to the secondrequestor upon receiving the read data from the module representation Cand upon receiving an indication that the read data is to be sent to thesecond requestor.

When the read operation is to be performed from the memory device modulerepresentation MemY by the second requestor, the instruction ofperforming the read operation and the address of the read operation areprovided as the intermediate value IV2 to the module representation D.The module representation D requests data to be read from the address ofthe memory device module representation MemY. Upon receiving the requestfor reading the data, the memory device module representation MemYprovides the output O2 as data to the module representation D. Moreover,the module representation D determines that the second requestorrequested the read operation and provides the read data to the modulerepresentation B for sending to the second requestor. The modulerepresentation B provides the data D1 as an output to the secondrequestor upon receiving the read data from the module representation Dand upon receiving an indication that the read data is to be sent to thesecond requestor.

A test output is compared by the processor 101 with a correspondingexpected output to determine whether the scenario model 1460 passes atest for the read operation. For example, it is determined by theprocessor 101 whether the test output O1 is the same as or is within apre-determined threshold of the expected output O1. Upon determiningthat the test output O1 is the same as or is within a pre-determinedthreshold of the expected output O1, the processor 101 determines thatthe scenario model 1450 passes a test for the read operation. On theother hand, upon determining that the test output O1 is not the same asor is not within the pre-determined threshold of the expected output O1,the processor 101 determines that the scenario model 1450 fails a testfor the read operation. As another example, it is determined by theprocessor 101 whether the test output O2 is the same as or is within apre-determined threshold of the expected output O2. Upon determiningthat the test output O2 is the same as or is within a pre-determinedthreshold of the expected output O2, the processor 101 determines thatthe scenario model 1450 passes a test for the read operation. On theother hand, upon determining that the test output O2 is not the same asor is not within the pre-determined threshold of the expected output O2,the processor 101 determines that the scenario model 1450 fails a testfor the read operation.

In one embodiment, instead of the module representations A, B, C, D,MemX, and MemY, components of an SoC are used to describe FIG. 14E-2 .

FIG. 14F is a diagram of an embodiment of a system 1470 for generating astimulus for displaying video data and then generating test display databased on the stimulus to be compared with expected display data. Theprocessor 101 determines a video to be an expected output. The processor101 generates a verification space Vdisplay from a video display device.For example, the verification space Vdisplay performs the same functionsas that performed by the video display device. As another example, theverification space Vdisplay is a scenario model for the video displaydevice. To further illustrate, the verification space Vdisplay is ascenario model that has an application of functionality of the videodisplay device. The verification space Vdisplay is executed by theprocessor 101 to generate a decoded frame from the video, which is theexpected output, and to further determine that the decoded frame is tobe stored in a verification space Vmem2.

The verification space Vmem2 is created by the processor 101 based on amemory device that stores the decoded frame, and is executed by theprocessor 101 to store the decoded frame. For example, the verificationspace Vmem2 performs the same functions as that performed by the memorydevice that stores the decoded frame. As another example, theverification space Vmem2 is a scenario model for the memory device thatstores the decoded frame. To further illustrate, the verification spaceVmem2 is a scenario model that has an application of functionality ofthe memory device that stores the decoded frame.

The decoded frame is encoded by a verification space Vdecode to generatean encoded frame. The verification space Vdecode is created by theprocessor 101 based on a video decoder, and is executed by the processor101. For example, the verification space Vdecode performs the samefunctions as that performed by the video decoder. As another example,the verification space Vdecode is a scenario model for the videodecoder. To further illustrate, the verification space Vdecode is ascenario model that has an application of functionality of the videodecoder. The encoded frame is stored in a verification space Vmem1 bythe processor 101. The verification space Vmem1 is created by theprocessor 101 based on a memory device that stores the encoded frame,and is executed by the processor 101 to store the encoded frame. Forexample, the verification space Vmem1 performs the same functions asthat performed by the memory device that stores the encoded frame. Asanother example, the verification space Vmem1 is a scenario model forthe memory device that stores the encoded frame. To illustrate, theverification space Vmem1 is a scenario model that has an application offunctionality of the memory device that stores the encoded frame.

The video decoder receives the encoded frame, which is an example of theinput I1, and decodes the encoded frame to generate the decoded frame,which is an example of the intermediate value IV1. The video displaydevice receives the decoded frame and displays the video frame as thevideo, which is an example of the output O1.

In one embodiment, the verification space Vdecode is executed in onethread, e.g., a producer thread, etc., and the verification spaceVdisplay is executed in another thread, e.g., a consumer thread, etc.

In an embodiment, a verification space is generated and executed by theprocessor 101.

In one embodiment, all module representations described herein aregenerated and executed by the processor 101.

It should be noted that although some the above embodiments aredescribed with respect to the computing device, in an embodiment,instead of the processors of the computing device, processors ofdifferent computing devices are used. For example, the processor 110 ofthe computing device parses the file that defines the SoC and aprocessor of another computing device executes the comparator 220 (FIG.2A-2 ).

It is noted that although some of the above-described embodiments aredescribed with respect to the processor 101, in one embodiment, anotherprocessor is used to perform the operations described herein as beingperformed by the processor 101.

In an embodiment, instead of a memory device, a virtual memory device,e.g., a range of memory addresses within a memory device, etc., is used.

In one embodiment, a scenario model that includes information that isnot specific to an SoC, e.g., a processor, an integrated circuit, etc.,is applied by the processor 101 to another SoC, e.g., for testing theother SoC.

In one embodiment, a scenario model is generated to achieve anextraordinary outcome, which is an example of an expected output or asecondary outcome. For example, a scenario model is generated to dividea number by zero. Another scenario model is generated to add two numbersto achieve a carry over. It should be noted that an ordinary outcome ofa scenario model is an example of a primary outcome. For example, aresult of an addition that does not include a carry-over is an ordinaryoutcome. As another example, a division by a number that generates noremainder is an ordinary outcome.

In an embodiment, multiple scenario models are executed in parallel toperform a test. For example, a first application scenario model isexecuted simultaneously with a second application scenario model. Inthis example, the first application scenario model is executed togenerate a primary outcome or a secondary outcome and the secondapplication scenario model is executed to generate a primary outcome ora secondary outcome. As another example, a first driver scenario modelis executed simultaneously with a second driver scenario model or anapplication scenario model. In this example, the first driver scenariomodel is executed to generate a primary outcome or a secondary outcomeand the second driver scenario model or the application scenario modelis executed to generate a primary outcome or a secondary outcome. Toillustrate, inputs snoops to a cache module representation are set upsimultaneously with executing a read or a write request to the cachemodule representation. As yet another example, a first performancescenario model is executed at the same time as a second performancescenario model or an application scenario model or a driver scenariomodel. In this example, the first performance scenario model is executedto generate a primary outcome or a secondary outcome and the secondperformance scenario model or the application scenario model or thedriver scenario model is executed to generate a primary outcome or asecondary outcome.

In one embodiment, a value of a primary outcome is used as a value of asecondary outcome. For example, a memory address that is output from acache module representation is used as a secondary outcome to generate astimulus. The stimulus is generated by applying a function performed bythe cache module representation different from a function performed togenerate the memory address. To further illustrate, the memory addressoutput is generated by applying a primary function of the cache modulerepresentation of facilitating a read from or a write of data to thecache module representation and the stimulus is generated to fetch datafrom the memory address of a main memory device module representation.

In an embodiment, a value of a secondary outcome is used as a value of aprimary outcome.

It should further be noted that although some of the embodimentsdescribed above relate to the functions, described above, as beingperformed by a digital camera, in one embodiment, the embodimentsequally apply to various other functions, e.g., resetting registers,resetting addresses within a memory device, generating interrupts,interrupt handling, handling contention for shared resources, committingwrite data to an address of a memory device before a read operation isto be performed, generation of randomized page tables and selectingmemory addresses to hit and miss in the page tables, randomizedswitching between clock and power modes of the system and power controlmodule representation, controlling memory stall rates, etc. The variousother functions are performed by one or more components of an SoC.

Other examples of the various other functions include allocating memorybuffers and freeing the buffers on demand, random use of addresses of acache to create cache line collisions to test cache coherency, partialre-use of recently freed buffers, checking accessibility of a CPU to oneor more registers, checking accessibility of a CPU to one or more memorydevices, checking a component of an SoC to determine whether thecomponent is able to drive an I/O or generate an interrupt, concurrentperformance of multiple components of an SoC, checking register values,checking I/Os, sending data to an I/O, receiving data from an I/O,logging diagnostic messages on progress of threads, logging diagnosticmessages on a state of a memory device, checking memory data buffers,checking time elapsed between two events occurring using a number ofscenario models, etc. In one embodiment, an event is a function that isperformed to generate a test outcome.

Yet other examples of the various other functions include transferringdata from a memory device via a component of an SoC to an output port ofthe SoC, transferring data from the component to the output port,transferring data from an input port of the SoC via a component of theSoC to the memory device, transferring data from the input port to thecomponent, transferring data from one memory device to another memorydevice, etc. In one embodiment, a DMA agent is used to transfer data.

Further examples of the various other functions include sending aninterrupt from an IP block to a CPU that services the interrupt. Theinterrupt is sent when the IP block finishes execution of its task.Moreover, the CPU is assigned to the IP block for an amount of time theIP block finishes execution of the task. In an embodiment, CPUs are notassigned to IP blocks. In this embodiment, any CPU receives an interruptfrom an IP block and upon receiving the interrupt, sets a mutex for theinterrupt so that another CPU is able to service a task to be performedby the IP block. In one embodiment, an interrupt handler, which is anexample of a computer software program, services an IP block until atask is finished execution by the IP block. The interrupt handlergenerates an interrupt when the IP block finishes execution of the task.In an embodiment, the interrupt handler is executed under an operatingsystem (OS) or a real time operation system (RTOS).

It should further be noted that although some of the embodimentsdescribed above relate to functions performed by an SoC, the embodimentsapply to components that are located outside the SoC. For example,asynchronous events, e.g., external bus masters, I/Os, externalinterrupts, fault injections to or from an external component, faultresets of an external component or received from an external component,etc., that are associated with devices external to an SoC are testedusing the embodiments described above. To further illustrate, when afault signal is sent to an external component and an acknowledgment ofthe fault signal is not received from the external component within apre-determined time period, the processor 101 determines that theexternal component fails a test.

In one embodiment, an SoC is implemented within a computing device, amobile phone, a home appliance, a television, a smart television, atablet, the Internet, a computer network, an Intranet, etc.

Moreover, although the above embodiments are described with respect to aprocessor, in one embodiment, the functions described herein are beingperformed by the processor are performed instead by one or more virtualmachines (VMs) or by one or more servers or by multiple processors.

In some embodiments, a scenario model, as used herein, is a scenario.Moreover, in these embodiments, multiple scenarios form a scenariomodel.

In one embodiment, any operations, described herein, as being performedby a GPU are performed by a processor, e.g., the processor 101, etc.

Embodiments described herein may be practiced with various computersystem configurations including hand-held hardware units, microprocessorsystems, microprocessor-based or programmable consumer electronics,minicomputers, mainframe computers and the like. In one embodiment, theembodiments described herein are practiced in distributed computingenvironments where tasks are performed by remote processing hardwareunits that are linked through a computer network.

With the above embodiments in mind, it should be understood that some ofthe embodiments employ various computer-implemented operations involvingdata stored in computer systems. These operations are those physicallymanipulating physical quantities. Any of the operations described hereinthat form part of the embodiments are useful machine operations.

Some of the embodiments also relate to a hardware unit or an apparatusfor performing these operations. The apparatus is specially constructedfor a special purpose computer. When defined as a special purposecomputer, the computer performs other processing, program execution orroutines that are not part of the special purpose, while still beingcapable of operating for the special purpose.

In one embodiment, the operations described herein are processed by acomputer selectively activated or configured by one or more computerprograms stored in a computer memory, cache, or obtained over a computernetwork. When data is obtained over the computer network, the data isprocessed by other computers on the computer network, e.g., a cloud ofcomputing resources.

In an embodiment, one or more embodiments, described above, arefabricated as computer-readable code on a non-transitorycomputer-readable medium. The non-transitory computer-readable medium isany data storage hardware unit, e.g., a memory device, etc., that storesdata, which is thereafter be read by a computer system. Examples of thenon-transitory computer-readable medium include hard drives, networkattached storage (NAS), ROM, RAM, compact disc-ROMs (CD-ROMs),CD-recordables (CD-Rs), CD-rewritables (CD-RWs), magnetic tapes andother optical and non-optical data storage hardware units. In anembodiment, the non-transitory computer-readable medium includes acomputer-readable tangible medium distributed over a network-coupledcomputer system so that the computer-readable code is stored andexecuted in a distributed fashion.

Although the method operations above were described in a specific order,it should be understood that in various embodiments, other housekeepingoperations are performed in between operations, or the method operationsare adjusted so that they occur at slightly different times, or aredistributed in a system which allows the occurrence of the methodoperations at various intervals, or are performed in a different orderthan that described above.

It should further be noted that in an embodiment, one or more featuresfrom any embodiment described above are combined with one or morefeatures of any other embodiment without departing from a scopedescribed in various embodiments described in the present disclosure.

Although the foregoing embodiments have been described in some detailfor purposes of clarity of understanding, it will be apparent thatcertain changes and modifications can be practiced within the scope ofappended claims. Accordingly, the present embodiments are to beconsidered as illustrative and not restrictive, and the embodiments arenot to be limited to the details given herein, but may be modifiedwithin the scope and equivalents of the appended claims.

The invention claimed is:
 1. A method for testing a system-on-a-chip(SoC), comprising: receiving a plurality of application scenario models,wherein the plurality of application scenario models are associated witha plurality of expected results, wherein each of the plurality ofexpected results is back propagated via a corresponding one of theplurality of application scenario models to generate a stimulus at aninput of the corresponding one of the plurality of application scenariomodels, wherein the plurality of application scenario models include afirst application scenario model and a second application scenariomodel, wherein the first application scenario model includes a firstplurality of driver scenario models coupled in series and the secondapplication scenario model includes a second plurality of driverscenario models coupled in series, wherein the first plurality of driverscenario models and the second plurality of driver scenario models haveat least one driver scenario model in common; dividing the plurality ofapplication scenario models between a plurality of processing units; andcontrolling the plurality of processing units to apply the stimuli tothe plurality of application scenario models to facilitate generation ofa plurality of test results, wherein the plurality of test results areused for said testing of the SoC.
 2. The method of claim 1, wherein thefirst plurality of driver scenario models define a first set offunctions to be executed by the SoC and the second plurality of driverscenario models define a second set of functions to be executed by theSoC.
 3. The method of claim 1, wherein the plurality of expected resultsinclude a first expected result and a second expected result, whereinthe first expected result is at an output of the first applicationscenario model and the second expected result is at an output of thesecond application scenario model, wherein said each of the plurality ofexpected results is back propagated via the corresponding one of theplurality of application scenario models to generate the stimulus at theinput of the corresponding one of the plurality of application scenariomodels by: applying a first set of functions defined by the firstplurality of scenario models of the first application scenario model tothe first expected result to determine a first input value at an inputof the first application scenario model; or applying a second set offunctions defined by the second plurality of scenario models of thesecond application scenario model to the second expected result todetermine a second input value at an input of the second applicationscenario model.
 4. The method of claim 1, wherein the plurality ofprocessing units include a first processing unit and a second processingunit, wherein said dividing the plurality of application scenario modelsbetween the plurality of processing units includes: scheduling a firstone of the first plurality of driver scenario models to be executed bythe first processing unit; and scheduling a second one of the firstplurality of driver scenario models to be executed by the secondprocessing unit.
 5. The method of claim 4, wherein the second one of thefirst plurality of driver scenario models is scheduled to be executed bythe second processing unit after said scheduling the first one of thefirst plurality of driver scenario models.
 6. The method of claim 4,further comprising: scheduling a first one of the second plurality ofdriver scenario models to be executed by the second processing unit; andscheduling a second one of the second plurality of driver scenariomodels to be executed by the first processing unit.
 7. The method ofclaim 6, wherein the first one of the first plurality of driver scenariomodels is scheduled to be executed simultaneous with the execution ofthe first one of the second plurality of driver scenario models.
 8. Themethod of claim 1, wherein the plurality of processing units include afirst central processing unit (CPU) and a second CPU, wherein thestimulus includes a first input value and a second input value, whereinthe plurality of test results include a first test result and a secondtest result, wherein said controlling the plurality of processing unitsto apply the stimuli to the plurality of application scenario models tofacilitate generation of the plurality of test results comprises:sending the first input value to the first CPU to facilitate applicationof the first input value to a set of functions of the first plurality ofdriver scenario models; and sending the second input value to the secondCPU to facilitate application of the second input value to a set offunctions of the second plurality of driver scenario models.
 9. Themethod of claim 8, wherein the plurality of expected results include afirst expected result and a second expected result, the method furthercomprising: receiving the first test result of application of the firstinput to the set of functions of the first plurality of driver scenariomodels; receiving the second test result of application of the secondinput to the set of functions of the second plurality of driver scenariomodels, wherein said testing of the SoC includes: determining whetherthe first test result matches the first expected result; determiningwhether the second test result matches the second expected result; anddetermining that the SoC passes the test upon determining that the firsttest result matches the first expected result and the second test resultmatches the second expected result.
 10. A method for testing asystem-on-a-chip (SoC), comprising: receiving a plurality of applicationscenario models, wherein the plurality of application scenario modelsare associated with a plurality of expected results, wherein each of theplurality of expected results is back propagated via a corresponding oneof the plurality of application scenario models to generate a stimulusat an input of the corresponding one of the plurality of applicationscenario models, wherein the plurality of application scenario modelsinclude a first application scenario model and a second applicationscenario model, wherein the first application scenario model includes afirst plurality of driver scenario models coupled in series and thesecond application scenario model includes a second plurality of driverscenario models coupled in series, wherein the first plurality of driverscenario models and the second plurality of driver scenario models donot have any driver scenario model in common; dividing the plurality ofapplication scenario models between a plurality of processing units; andcontrolling the plurality of processing units to apply the stimuli tothe plurality of application scenario models to facilitate generation ofa plurality of test results, wherein the plurality of test results areused for said testing of the SoC.
 11. A computer for testing asystem-on-a-chip (SoC), comprising: a processor configured to: access aplurality of application scenario models, wherein the plurality ofapplication scenario models are associated with a plurality of expectedresults, wherein each of the plurality of expected results is backpropagated via a corresponding one of the plurality of applicationscenario models to generate a stimulus at an input of the correspondingone of the plurality of application scenario models, wherein theplurality of application scenario models include a first applicationscenario model and a second application scenario model, wherein thefirst application scenario model includes a first plurality of driverscenario models coupled in series and the second application scenariomodel includes a second plurality of driver scenario models coupled inseries, wherein the first plurality of driver scenario models and thesecond plurality of driver scenario models have at least one driverscenario model in common; divide the plurality of application scenariomodels between a plurality of processing units; and control theplurality of processing units to apply the stimuli to the plurality ofapplication scenario models to facilitate generation of a plurality oftest results, wherein the plurality of test results are used to test theSoC; and a memory device coupled to the processor, wherein the memorydevice is configured to store the plurality of application scenariomodels.
 12. The computer of claim 11, wherein the first plurality ofdriver scenario models define a first set of functions of the SoC andthe second plurality of driver scenario models define a second set offunctions of the SoC.
 13. The computer of claim 11, wherein theplurality of expected results include a first expected result and asecond expected result, wherein the first expected result is at anoutput of the first application scenario model and the second expectedresult is at an output of the second application scenario model, whereinto back propagate said each of the plurality of expected results via thecorresponding one of the plurality of application scenario models togenerate the stimulus at the input of the corresponding one of theplurality of application scenario models, the processor is configuredto: apply a first set of functions of the first plurality of driverscenario models to the first expected result to determine a first inputvalue at an input of the first application scenario model; or apply asecond set of functions of the second plurality of driver scenariomodels to the second expected result to determine a second input valueat an input of the second application scenario model.
 14. The computerof claim 11, wherein the plurality of processing units include a firstprocessing unit and a second processing unit, wherein to divide theplurality of application scenario models between the plurality ofprocessing units, the processor is configured to: schedule a first oneof the first plurality of driver scenario models to be executed by thefirst processing unit; and schedule a second one of the first pluralityof driver scenario models to be executed by the second processing unit.15. The computer of claim 14, wherein the second one of the firstplurality of driver scenario models is scheduled to be executed by thesecond processing unit after the first one of the first plurality ofdriver scenario models is scheduled to be executed.
 16. The computer ofclaim 14, wherein the processor is configured to: schedule a first oneof the second plurality of driver scenario models to be executed by thesecond processing unit; and schedule a second one of the secondplurality of driver scenario models to be executed by the firstprocessing unit.
 17. The computer of claim 11, wherein the plurality ofprocessing units include a first central processing unit (CPU) and asecond CPU, wherein the stimulus includes a first input value and asecond input value, wherein the plurality of test results include afirst test result and a second test result, wherein to control theplurality of processing units to apply the stimuli to the plurality ofapplication scenario models to facilitate generation of the plurality oftest results, the processor is configured to: send the first input valueto the first CPU to facilitate application of the first input value to aset of functions of the first plurality of driver scenario models; andsend the second input value to the second CPU to facilitate applicationof the second input value to a set of functions of the second pluralityof driver scenario models.
 18. The computer of claim 17, wherein theplurality of expected results include a first expected result and asecond expected result, wherein the processor is configured to: receivethe first test result of application of the first input to the set offunctions of the first plurality of driver scenario models; receive thesecond test result of application of the second input to the set offunctions of the second plurality of driver scenario models, wherein totest of the SoC, the processor is configured to: determine whether thefirst test result matches the first expected result; determine whetherthe second test result matches the second expected result; and determinethat the SoC passes the test upon determining that the first test resultmatches the first expected result and the second test result matches thesecond expected result.
 19. A computer for testing a system-on-a-chip(SoC), comprising: a processor configured to: access a plurality ofapplication scenario models, wherein the plurality of applicationscenario models are associated with a plurality of expected results,wherein each of the plurality of expected results is back propagated viaa corresponding one of the plurality of application scenario models togenerate a stimulus at an input of the corresponding one of theplurality of application scenario models, wherein the plurality ofapplication scenario models include a first application scenario modeland a second application scenario model, wherein the first applicationscenario model include a first plurality of driver scenario modelscoupled in series and the second application scenario model includes asecond plurality of driver scenario models coupled in series, whereinthe first plurality of driver scenario models and the second pluralityof driver scenario models do not have any driver scenario model incommon; divide the plurality of application scenario models between aplurality of processing units; and control the plurality of processingunits to apply the stimuli to the plurality of application scenariomodels to facilitate generation of a plurality of test results, whereinthe plurality of test results are used to test the SoC; and a memorydevice coupled to the processor, wherein the memory device is configuredto store the plurality of application scenario models.